Semiconductor device

ABSTRACT

To provide a transistor having a high on-state current. A semiconductor device includes a first insulator containing excess oxygen, a first oxide semiconductor over the first insulator, a second oxide semiconductor over the first oxide semiconductor, a first conductor and a second conductor which are over the second oxide semiconductor and are separated from each other, a third oxide semiconductor in contact with side surfaces of the first oxide semiconductor, a top surface and side surfaces of the second oxide semiconductor, a top surface of the first conductor, and a top surface of the second conductor, a second insulator over the third oxide semiconductor, and a third conductor facing a top surface and side surfaces of the second oxide semiconductor with the second insulator and the third oxide semiconductor therebetween. The first oxide semiconductor has a higher oxygen-transmitting property than the third oxide semiconductor.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of U.S. application Ser. No. 14/571,981, filed Dec. 16, 2014, now allowed, which claims the benefit of a foreign priority application filed in Japan as Serial No. 2013-262873 on Dec. 19, 2013, both of which are incorporated by reference.

BACKGROUND OF THE INVENTION 1. Field of the Invention

The present invention relates to an object, a method, or a manufacturing method. Furthermore, the present invention relates to a process, a machine, manufacture, or a composition of matter. In particular, the present invention relates to, for example, a semiconductor, a semiconductor device, a display device, a light-emitting device, a lighting device, a power storage device, a memory device, or a processor. The present invention relates to a method for manufacturing a semiconductor, a semiconductor device, a display device, a light-emitting device, a lighting device, a power storage device, a memory device, or a processor. The present invention relates to a method for driving a semiconductor device, a display device, a light-emitting device, a lighting device, a power storage device, a memory device, or a processor.

In this specification and the like, a semiconductor device generally means a device that can function by utilizing semiconductor characteristics. A display device, a light-emitting device, a lighting device, an electro-optical device, a semiconductor circuit, and an electronic device include a semiconductor device in some cases.

2. Description of the Related Art

A technique for forming a transistor by using a semiconductor over a substrate having an insulating surface has attracted attention. The transistor is applied to a wide range of semiconductor devices such as an integrated circuit and a display device. A silicon layer is known as a semiconductor applicable to a transistor.

Whether an amorphous silicon layer or a polycrystalline silicon layer is used as a semiconductor in a transistor depends on the purpose. For example, in the case of a transistor included in a large display device, an amorphous silicon layer, which can be formed using an established technique for forming a film over a large substrate, is preferably used. On the other hand, in the case of a transistor included in a high-performance display device where driver circuits are formed over the same substrate, a polycrystalline silicon layer, which can form a transistor having high field-effect mobility, is preferably used. As a method for forming a polycrystalline silicon layer, high-temperature heat treatment or laser light treatment which is performed on an amorphous silicon layer has been known.

In recent years, an oxide semiconductor has attracted attention. An oxide semiconductor can be formed by a sputtering method or the like, and thus can be used for a semiconductor of a transistor in a large display device. A transistor including an oxide semiconductor has high field-effect mobility; therefore, a high-performance display device where driver circuits are formed over the same substrate can be obtained. In addition, there is an advantage that capital investment can be reduced because part of production equipment for a transistor including an amorphous silicon layer can be retrofitted and utilized.

As a method for providing a transistor including an oxide semiconductor with stable electrical characteristics, a technique where an insulator in contact with an oxide semiconductor is doped with oxygen is disclosed (see Patent Document 1). The technique disclosed in Patent Document 1 enables oxygen vacancies in an oxide semiconductor to be reduced. As a result, variation in electrical characteristics of a transistor including an oxide semiconductor can be reduced and reliability can be improved.

A transistor including an oxide semiconductor film is known to have an extremely low leakage current in an off state. For example, a low-power CPU and the like utilizing the leakage current of a transistor including an oxide semiconductor film are disclosed (see Patent Document 2).

Patent Document 3 discloses that a transistor having high field-effect mobility can be obtained by a well potential formed using an active layer formed of a semiconductor film.

REFERENCE Patent Document

-   [Patent Document 1] Japanese Published Patent Application No.     2011-243974 -   [Patent Document 2] Japanese Published Patent Application No.     2012-257187 -   [Patent Document 3] Japanese Published Patent Application No.     2012-59860

SUMMARY OF THE INVENTION

An object is to provide a transistor having a high on-state current. Another object is to provide a transistor having a low off-state current. Another object is to provide a transistor having stable electrical characteristics. Another object is to provide a semiconductor device including the transistor. Another object is to provide a durable semiconductor device. Another object is to provide a novel semiconductor device.

Note that the descriptions of these objects do not disturb the existence of other objects. In one embodiment of the present invention, there is no need to achieve all the objects. Other objects will be apparent from and can be derived from the description of the specification, the drawings, the claims, and the like.

(1)

An embodiment of the present invention is a semiconductor device including a first insulator containing excess oxygen, a first oxide semiconductor over the first insulator, a second oxide semiconductor over the first oxide semiconductor, a first conductor and a second conductor which are over the second oxide semiconductor and are separated from each other, a second insulator over the second oxide semiconductor, the first conductor, and the second conductor, and a third conductor facing the second oxide semiconductor with the second insulator provided therebetween. The first oxide semiconductor has an oxygen-transmitting property.

(2)

Another embodiment of the present invention is a semiconductor device including a first insulator containing excess oxygen, a first oxide semiconductor over the first insulator, a second oxide semiconductor over the first oxide semiconductor, a first conductor and a second conductor which are over the second oxide semiconductor and are separated from each other, a third oxide semiconductor in contact with a side surface of the first oxide semiconductor, a top surface and a side surface of the second oxide semiconductor, a top surface of the first conductor, and a top surface of the second conductor, a second insulator over the third oxide semiconductor, and a third conductor facing the top surface and the side surface of the second oxide semiconductor with the second insulator and the third oxide semiconductor provided therebetween. The first oxide semiconductor has a higher oxygen-transmitting property than the third oxide semiconductor.

(3)

Another embodiment of the present invention is a semiconductor device including a first insulator containing excess oxygen, a first oxide semiconductor over the first insulator, a second oxide semiconductor over the first oxide semiconductor, a first conductor and a second conductor which are over the second oxide semiconductor and are separated from each other, a third oxide semiconductor in contact with a side surface of the first oxide semiconductor, a top surface and a side surface of the second oxide semiconductor, a top surface of the first conductor, and a top surface of the second conductor, a second insulator over the third oxide semiconductor, and a third conductor facing the top surface and the side surface of the second oxide semiconductor with the second insulator and the third oxide semiconductor provided therebetween. The first oxide semiconductor has lower density than the third oxide semiconductor.

(4)

Another embodiment of the present invention is a semiconductor device including a first insulator containing excess oxygen, a first oxide semiconductor over the first insulator, a second oxide semiconductor over the first oxide semiconductor, a first conductor and a second conductor which are over the second oxide semiconductor and are separated from each other, a third oxide semiconductor in contact with a side surface of the first oxide semiconductor, a top surface and a side surface of the second oxide semiconductor, a top surface of the first conductor, and a top surface of the second conductor, a second insulator over the third oxide semiconductor, and a third conductor facing the top surface and the side surface of the second oxide semiconductor with the second insulator and the third oxide semiconductor provided therebetween. The first oxide semiconductor has lower crystallinity than the third oxide semiconductor.

(5)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (4) including a third insulator covering at least the first insulator, the first oxide semiconductor, and the second oxide semiconductor and the third insulator has a function of blocking oxygen.

(6)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (4) including a third insulator covering at least the first insulator, the first oxide semiconductor, and the second oxide semiconductor and the third insulator has a function of blocking hydrogen.

(7)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (6) in which the first oxide semiconductor has a lower electron affinity than the second oxide semiconductor.

(8)

Another embodiment of the present invention is the semiconductor device of any one of (2) to (7) in which the third oxide semiconductor has a lower electron affinity than the second oxide semiconductor.

(9)

Another one embodiment of the present invention is the semiconductor device of any one of (1) to (8) in which the first oxide semiconductor has a larger energy gap than the second oxide semiconductor.

(10)

Another embodiment of the present invention is the semiconductor device of any one of (2) to (9) in which the third oxide semiconductor has a larger energy gap than the second oxide semiconductor.

(11)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (10) in which the first insulator is a silicon oxide layer or a silicon oxynitride layer.

(12)

Another embodiment of the present invention is the semiconductor device of any one of (2) to (11) in which the third oxide semiconductor has a function of blocking oxygen.

(13)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (12) in which the second insulator has a region whose hydrogen concentration measured by secondary ion mass spectrometry is lower than 1×10¹⁹ atoms/cm³.

(14)

Another embodiment of the present invention is the semiconductor device of any one of (2) to (13) in which the third oxide semiconductor, the second insulator, and the third conductor have similar end shapes when seen from the above.

(15)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (14) in which the second oxide semiconductor contains excess oxygen.

(16)

Another embodiment of the present invention is the semiconductor device of any one of (1) to (15) including a fourth insulator over the third insulator. The fourth insulator has a region whose hydrogen concentration measured by secondary ion mass spectrometry is higher than that of a region of the second oxide semiconductor.

Note that in the semiconductor device of one embodiment of the present invention, the oxide semiconductor may be replaced with another semiconductor.

A transistor having a high current in an on state can be provided. A transistor with a low off-state current can be provided. A transistor having stable electrical characteristics can be provided. A semiconductor device including the transistor can be provided. A durable semiconductor device can be provided. A novel semiconductor device can be provided.

Note that the description of these effects does not disturb the existence of other effects. One embodiment of the present invention does not necessarily achieve all the effects listed above. Other effects will be apparent from and can be derived from the description of the specification, the drawings, the claims, and the like.

BRIEF DESCRIPTION OF THE DRAWINGS

In the accompanying drawings:

FIGS. 1A and 1B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIG. 2 is a perspective view illustrating a cross section of a transistor of one embodiment of the present invention;

FIGS. 3A and 3B illustrate a band diagram of part of a transistor of one embodiment of the present invention and a path of an on-state current;

FIGS. 4A to 4C illustrate flow of electrons in a transistor of one embodiment of the present invention in an on state;

FIGS. 5A and 5B are cross-sectional views each illustrating a transistor of one embodiment of the present invention;

FIGS. 6A and 6B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 7A and 7B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 8A and 8B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 9A and 9B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 10A and 10B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 11A and 11B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 12A and 12B are cross-sectional views illustrating a method for manufacturing a transistor of one embodiment of the present invention;

FIGS. 13A, 13B, 13C1, and 13C2 are cross-sectional views illustrating the method for manufacturing a transistor of one embodiment of the present invention;

FIGS. 14A and 14B are cross-sectional views illustrating the method for manufacturing a transistor of one embodiment of the present invention;

FIGS. 15A and 15B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 16A and 16B are cross-sectional views each illustrating a transistor of one embodiment of the present invention;

FIGS. 17A and 17B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 18A and 18B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 19A and 19B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention;

FIGS. 20A and 20B are each a cross-sectional view illustrating a transistor of one embodiment of the present invention;

FIGS. 21A and 21B are each a cross-sectional view of a semiconductor device of one embodiment of the present invention;

FIGS. 22A and 22B are each a circuit diagram of a semiconductor device of one embodiment of the present invention;

FIGS. 23A and 23B are each a circuit diagram of a memory device of one embodiment of the present invention;

FIG. 24 is a block diagram of an RF tag of one embodiment of the present invention;

FIGS. 25A to 25F are views illustrating application examples of an RF tag of one embodiment of the present invention;

FIG. 26 is a block diagram illustrating a CPU of one embodiment of the present invention;

FIG. 27 is a circuit diagram of a memory element of one embodiment of the present invention;

FIGS. 28A to 28C are a top view and circuit diagrams of a display device of one embodiment of the present invention;

FIG. 29 illustrates a display module of one embodiment of the present invention;

FIGS. 30A to 30F are views each illustrating an electronic device of one embodiment of the present invention;

FIGS. 31A to 31D are Cs-corrected high-resolution TEM images of a cross section of a CAAC-OS and a cross-sectional schematic view of the CAAC-OS;

FIGS. 32A to 32D are Cs-corrected high-resolution TEM images of a plane of a CAAC-OS;

FIGS. 33A to 33C show structural analysis of a CAAC-OS and a single crystal oxide semiconductor by XRD;

FIG. 34 is a view illustrating a movement path of oxygen in an In—Ga—Zn oxide;

FIGS. 35A to 35C show a relationship between substrate temperature in film formation and top surface roughness;

FIGS. 36A to 36C show a relationship between the percentage of an oxygen gas in film formation and top surface roughness;

FIG. 37 shows a relationship between substrate temperature in film formation, the percentage of an oxygen gas, and XRD spectra;

FIG. 38 shows a relationship between the percentage of an oxygen gas in film formation and proportion of CAAC;

FIG. 39 shows a relationship between substrate temperature in film formation, the percentage of an oxygen gas, and XRD spectra;

FIG. 40 shows a relationship between substrate temperature in film formation, the percentage of an oxygen gas in film formation, and XRD intensity due to CAAC;

FIG. 41 shows a relationship between substrate temperature in film formation, the percentage of an oxygen gas in film formation, and film density;

FIG. 42 shows a relationship between film density and XRD intensity due to CAAC;

FIG. 43 shows analysis results of diffusion of ¹⁸O by SIMS;

FIG. 44 shows analysis results of diffusion of ¹⁸O by SIMS;

FIG. 45 shows a method for analyzing a diffusion length of ¹⁸O with SIMS analysis results;

FIG. 46 shows a relationship between film density and a diffusion length;

FIG. 47 shows electrical characteristics of transistors;

FIG. 48 shows electrical characteristics of transistors;

FIG. 49 shows electrical characteristics of transistors;

FIG. 50 shows electrical characteristics of transistors;

FIGS. 51A and 51B each show electrical characteristics of transistors;

FIGS. 52A and 52B show electron diffraction patterns of a CAAC-OS; and

FIG. 53 shows a change in crystal part of an In—Ga—Zn oxide by electron irradiation.

DETAILED DESCRIPTION OF THE INVENTION

Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. However, the present invention is not limited to the description below, and it is easily understood by those skilled in the art that modes and details disclosed herein can be modified in various ways. Furthermore, the present invention is not construed as being limited to description of the embodiments. In describing structures of the present invention with reference to the drawings, common reference numerals are used for the same portions in different drawings. Note that the same hatched pattern is applied to similar parts, and the similar parts are not especially denoted by reference numerals in some cases.

Note that the size, the thickness of films (layers), or regions in diagrams may be exaggerated for clarity.

A voltage usually refers to a potential difference between a given potential and a reference potential (e.g., a source potential or a ground potential (GND)). A voltage can be referred to as a potential and vice versa.

Note that the ordinal numbers such as “first” and “second” in this specification are used for the sake of convenience and do not denote the order of steps or the stacking order of layers. Therefore, for example, the term “first” can be replaced with the term “second”, “third”, or the like as appropriate. In addition, the ordinal numbers in this specification and the like are not necessarily the same as the ordinal numbers used to specify one embodiment of the present invention.

Note that a “semiconductor” includes characteristics of an “insulator” in some cases when the conductivity is sufficiently low, for example. Furthermore, a “semiconductor” and an “insulator” cannot be strictly distinguished from each other in some cases because a border between the “semiconductor” and the “insulator” is not clear. Accordingly, a “semiconductor” in this specification can be called an “insulator” in some cases. Similarly, an “insulator” in this specification can be called a “semiconductor” in some cases.

Furthermore, a “semiconductor” includes characteristics of a “conductor” in some cases when the conductivity is sufficiently high, for example. Furthermore, a “semiconductor” and a “conductor” cannot be strictly distinguished from each other in some cases because a border between the “semiconductor” and the “conductor” is not clear. Accordingly, a “semiconductor” in this specification can be called a “conductor” in some cases. Similarly, a “conductor” in this specification can be called a “semiconductor” in some cases.

Note that an impurity in a semiconductor refers to, for example, elements other than the main components of a semiconductor. For example, an element with a concentration of lower than 0.1 atomic % is an impurity. When an impurity is contained, the density of states (DOS) may be formed in a semiconductor, the carrier mobility may be decreased, or the crystallinity may be decreased, for example. When the semiconductor is an oxide semiconductor, examples of an impurity which changes the characteristics of the semiconductor include Group 1 elements, Group 2 elements, Group 14 elements, Group 15 elements, and transition metals other than the main components; specifically, there are hydrogen (including water), lithium, sodium, silicon, boron, phosphorus, carbon, and nitrogen, for example. When the semiconductor is an oxide semiconductor, oxygen vacancies may be formed by entry of impurities such as hydrogen, for example. Furthermore, when the semiconductor is silicon, examples of an impurity which changes the characteristics of the semiconductor include oxygen, Group 1 elements except hydrogen, Group 2 elements, Group 13 elements, and Group 15 elements.

In embodiments described below, the case where the semiconductor is an oxide semiconductor is described; however, one embodiment of the present invention is not limited thereto. For example, as the semiconductor, silicon, germanium, or the like which has a polycrystalline structure, a single crystal structure, or the like may be used. Alternatively, a semiconductor having distortion such as distorted silicon may be used. Alternatively, as the semiconductor, gallium arsenide, aluminum gallium arsenide, indium gallium arsenide, gallium nitride, indium phosphide, silicon germanium, or the like which can be used for a high-electron-mobility transistor (HEMT) may be used. By using any of these semiconductors, a transistor capable of high speed operation can be obtained.

In this specification, the phrase “A has a region with a concentration B” includes, for example, “the concentration of the entire region in a region of A in the depth direction is B”, “the average concentration in a region of A in the depth direction is B”, “the median value of a concentration in a region of A in the depth direction is B”, “the maximum value of a concentration in a region of A in the depth direction is B”, “the minimum value of a concentration in a region of A in the depth direction is B”, “a convergence value of a concentration in a region of A in the depth direction is B”, and “a concentration in a region of A in which a probable value is obtained in measurement is B”.

In this specification, the phrase “A has a region with a size B, a length B, a thickness B, a width B, or a distance B” includes, for example, “the size, the length, the thickness, the width, or the distance of the entire region in a region of A is B”, “the average value of the size, the length, the thickness, the width, or the distance of a region of A is B”, “the median value of the size, the length, the thickness, the width, or the distance of a region of A is B”, “the maximum value of the size, the length, the thickness, the width, or the distance of a region of A is B”, “the minimum value of the size, the length, the thickness, the width, or the distance of a region of A is B”, “a convergence value of the size, the length, the thickness, the width, or the distance of a region of A is B”, and “the size, the length, the thickness, the width, or the distance of a region of A in which a probable value is obtained in measurement is B”.

<Transistor Structure>

Transistor structures of embodiments of the present invention will be described below.

<Transistor Structure 1>

FIGS. 1A and 1B are a top view and a cross-sectional view of a transistor of one embodiment of the present invention. FIG. 1A is a top view and FIG. 1B is a cross-sectional view taken along dashed-dotted line A1-A2 and dashed-dotted line A3-A4 in FIG. 1A. Note that for simplification of the drawing, some components are not illustrated in the top view in FIG. 1A.

FIG. 2 is a perspective view illustrating the cross section taken along line A1-A2 in the transistor in FIGS. 1A and 1B. Note that for simplification of the drawing, some components are not illustrated in FIG. 2.

The transistor in FIGS. 1A and 1B includes a conductor (conductive layer) 413 over a substrate 400, an insulator (insulating layer) 402 having a projection over the substrate 400 and the conductor 413, a semiconductor (semiconductor layer) 406 a over the projection of the insulator 402, a semiconductor 406 b over the semiconductor 406 a, a conductor 416 a and a conductor 416 b which are in contact with a top surface and a side surface of the semiconductor 406 b and which are arranged to be separated from each other, a semiconductor 406 c over the semiconductor 406 b, the conductor 416 a, and the conductor 416 b, an insulator 412 over the semiconductor 406 c, a conductor 404 over the insulator 412, an insulator 408 over the conductor 416 a, the conductor 416 b, and the conductor 404, and an insulator 418 over the insulator 408.

Note that the semiconductor 406 c is in contact with at least a top surface and a side surface of the semiconductor 406 b in the cross section taken along line A3-A4. Furthermore, the conductor 404 faces the top surface and the side surface of the semiconductor 406 b with the semiconductor 406 c and the insulator 412 provided therebetween in the cross section taken along line A3-A4. The conductor 413 faces a bottom surface of the semiconductor 406 b with the insulator 402 provided therebetween. The insulator 402 does not necessarily include a projection. The semiconductor 406 c, the insulator 408, or the insulator 418 is not necessarily provided.

The semiconductor 406 b serves as a channel formation region of the transistor. The conductor 404 serves as a first gate electrode (also referred to as a front gate electrode) of the transistor. The conductor 413 serves as a second gate electrode (also referred to as a back gate electrode) of the transistor. The conductor 416 a and the conductor 416 b serve as a source electrode and a drain electrode of the transistor. The insulator 408 functions as a barrier layer. The insulator 408 has, for example, a function of blocking oxygen and/or hydrogen. Alternatively, the insulator 408 has, for example, a higher capability of blocking oxygen and/or hydrogen than the semiconductor 406 a and/or the semiconductor 406 c.

The insulator 402 is an insulator containing excess oxygen.

The insulator containing excess oxygen means an insulator from which oxygen is released by heat treatment, for example. The silicon oxide layer containing excess oxygen means a silicon oxide layer which can release oxygen by heat treatment or the like, for example. Therefore, the insulator 402 is an insulator in which oxygen can be moved. In other words, the insulator 402 may be an insulator having an oxygen-transmitting property. For example, the insulator 402 may be an insulator having a higher oxygen-transmitting property than the semiconductor 406 a.

The insulator containing excess oxygen has a function of reducing oxygen vacancies in the semiconductor 406 b in some cases. Such oxygen vacancies form DOS in the semiconductor 406 b and serve as hole traps or the like. In addition, hydrogen comes into the site of such oxygen vacancies and forms electrons serving as carriers. Therefore, by reducing the oxygen vacancies in the semiconductor 406 b, the transistor can have stable electrical characteristics.

Here, an insulator from which oxygen is released by heat treatment may release oxygen, the amount of which is higher than or equal to 1×10¹⁸ atoms/cm³, higher than or equal to 1×10¹⁹ atoms/cm³, or higher than or equal to 1×10²⁰ atoms/cm³ (converted into the number of oxygen atoms) in thermal desorption spectroscopy (TDS) analysis in the range of a surface temperature of 100° C. to 700° C. or 100° C. to 500° C.

Here, the method of measuring the amount of released oxygen using TDS analysis is described below.

The total amount of released gas from a measurement sample in TDS analysis is proportional to the integral value of the ion intensity of the released gas. Then, comparison with a reference sample is made, whereby the total amount of released gas can be calculated.

For example, the number of released oxygen molecules (N_(O2)) from a measurement sample can be calculated according to the following formula using the TDS results of a silicon substrate containing hydrogen at a predetermined density, which is a reference sample, and the TDS results of the measurement sample. Here, all gases having a mass number of 32 which are obtained in the TDS analysis are assumed to originate from an oxygen molecule. Note that CH₃OH, which is a gas having the mass number of 32, is not taken into consideration because it is unlikely to be present. Furthermore, an oxygen molecule including an oxygen atom having a mass number of 17 or 18 which is an isotope of an oxygen atom is also not taken into consideration because the proportion of such a molecule in the natural world is minimal.

N _(O2) =N _(H2) /S _(H2) ×S _(O2)×α

The value N_(H2) is obtained by conversion of the number of hydrogen molecules desorbed from the reference sample into densities. The value S_(H2) is the integral value of ion intensity in the case where the reference sample is subjected to the TDS analysis. Here, the reference value of the reference sample is set to N_(H2)/S_(H2). The value S_(O2) is the integral value of ion intensity when the measurement sample is analyzed by TDS. The value α is a coefficient affecting the ion intensity in the TDS analysis. Refer to Japanese Published Patent Application No. H6-275697 for details of the above formula. The amount of released oxygen was measured with a thermal desorption spectroscopy apparatus produced by ESCO Ltd., EMD-WA1000S/W using a silicon substrate containing hydrogen atoms at 1×10¹⁶ atoms/cm² as the reference sample.

Furthermore, in the TDS analysis, oxygen is partly detected as an oxygen atom. The ratio between oxygen molecules and oxygen atoms can be calculated from the ionization rate of the oxygen molecules. Note that, since the above a includes the ionization rate of the oxygen molecules, the amount of the released oxygen atoms can also be estimated through the evaluation of the amount of the released oxygen molecules.

Note that N_(O2) is the amount of the released oxygen molecules. The amount of released oxygen in the case of being converted into oxygen atoms is twice the amount of the released oxygen molecules.

Furthermore, the insulator from which oxygen is released by heat treatment may contain a peroxide radical. Specifically, the spin density attributed to the peroxide radical is greater than or equal to 5×10¹⁷ spins/cm³. Note that the insulator containing a peroxide radical may have an asymmetric signal with a g factor of approximately 2.01 in ESR.

The insulator containing excess oxygen may be formed using oxygen-excess silicon oxide (SiO_(X) (X>2)). In the oxygen-excess silicon oxide (SiO_(X) (X>2)), the number of oxygen atoms per unit volume is more than twice the number of silicon atoms per unit volume. The number of silicon atoms and the number of oxygen atoms per unit volume are measured by Rutherford backscattering spectrometry (RBS).

As illustrated in FIG. 1B, the side surfaces of the semiconductor 406 b are in contact with the conductor 416 a and the conductor 416 b. The semiconductor 406 b can be electrically surrounded by an electric field of the conductor 404 (a structure in which a semiconductor is electrically surrounded by an electric field of a conductor is referred to as a surrounded channel (s-channel) structure). Therefore, a channel is formed in the entire semiconductor 406 b (bulk) in some cases. In the s-channel structure, a large amount of current can flow between a source and a drain of a transistor, so that a high on-state current can be obtained.

The s-channel structure is suitable for a miniaturized transistor because a high on-state current can be obtained. A semiconductor device including the miniaturized transistor can have a high integration degree and high density. For example, the channel length of the transistor is preferably less than or equal to 40 nm, more preferably less than or equal to 30 nm, still more preferably less than or equal to 20 nm and the channel width of the transistor is preferably less than or equal to 40 nm, more preferably less than or equal to 30 nm, still more preferably less than or equal to 20 nm.

Note that the channel length refers to, for example, a distance between a source (a source region or a source electrode) and a drain (a drain region or a drain electrode) in a region where a semiconductor (or a portion where a current flows in a semiconductor when a transistor is on) and a gate electrode overlap with each other or a region where a channel is formed in a top view of the transistor. In one transistor, channel lengths in all regions are not necessarily the same. In other words, the channel length of one transistor is not limited to one value in some cases. Therefore, in this specification, the channel length is any one of values, the maximum value, the minimum value, or the average value in a region where a channel is formed.

A channel width refers to, for example, the length of a portion where a source and a drain face each other in a region where a semiconductor (or a portion where a current flows in a semiconductor when a transistor is on) and a gate electrode overlap with each other, or a region where a channel is formed in a top view. In one transistor, channel widths in all regions do not necessarily have the same value. In other words, a channel width of one transistor is not fixed to one value in some cases. Therefore, in this specification, a channel width is any one of values, the maximum value, the minimum value, or the average value in a region where a channel is formed.

Note that depending on transistor structures, a channel width in a region where a channel is formed actually (hereinafter referred to as an effective channel width) is different from a channel width shown in a top view of a transistor (hereinafter referred to as an apparent channel width) in some cases. For example, in a transistor having a three-dimensional structure, an effective channel width is greater than an apparent channel width shown in a top view of the transistor, and its influence cannot be ignored in some cases. For example, in a miniaturized transistor having a three-dimensional structure, the proportion of a channel region formed in a side surface of a semiconductor is higher than the proportion of a channel region formed in a top surface of the semiconductor in some cases. In that case, an effective channel width obtained when a channel is actually formed is greater than an apparent channel width shown in the top view.

In a transistor having a three-dimensional structure, an effective channel width is difficult to measure in some cases. For example, to estimate an effective channel width from a design value, it is necessary to assume that the shape of a semiconductor is known. Therefore, in the case where the shape of a semiconductor is not known accurately, it is difficult to measure an effective channel width accurately.

Therefore, in this specification, in a top view of a transistor, an apparent channel width that is a length of a portion where a source and a drain face each other in a region where a semiconductor and a gate electrode overlap with each other is referred to as a surrounded channel width (SCW) in some cases. Furthermore, in this specification, in the case where the term “channel width” is simply used, it may denote a surrounded channel width and an apparent channel width. Alternatively, in this specification, in the case where the term “channel width” is simply used, it may denote an effective channel width in some cases. Note that the values of a channel length, a channel width, an effective channel width, an apparent channel width, a surrounded channel width, and the like can be determined by obtaining and analyzing a cross-sectional TEM image and the like.

Note that in the case where field-effect mobility, a current value per channel width, and the like of a transistor are obtained by calculation, a surrounded channel width may be used for the calculation. In that case, a value different from one in the case where an effective channel width is used for the calculation is obtained in some cases.

Furthermore, by applying a lower voltage or a higher voltage than a source electrode to the conductor 413, the threshold voltage of the transistor may be shifted in the positive direction or the negative direction. For example, by shifting the threshold voltage of the transistor in the positive direction, a normally-off transistor in which the transistor is in a non-conduction state (off state) even when the gate voltage is 0 V can be achieved in some cases. The voltage applied to the conductor 413 may be a variable or a fixed voltage. When the voltage applied to the conductor 413 is a variable, a circuit for controlling the voltage may be electrically connected to the conductor 413.

A structure of an oxide semiconductor which can be used as the semiconductor 406 a, the semiconductor 406 b, the semiconductor 406 c, or the like is described below. In this specification, trigonal and rhombohedral crystal systems are included in a hexagonal crystal system. In this specification, the term “parallel” indicates that the angle formed between two straight lines is greater than or equal to −10° and less than or equal to 10°, and accordingly also includes the case where the angle is greater than or equal to −5° and less than or equal to 5°. The term “substantially parallel” indicates that the angle formed between two straight lines is greater than or equal to −30° and less than or equal to 30°. The term “perpendicular” indicates that the angle formed between two straight lines is greater than or equal to 80° and less than or equal to 100°, and accordingly includes the case where the angle is greater than or equal to 85° and less than or equal to 95°. The term “substantially perpendicular” indicates that the angle formed between two straight lines is greater than or equal to 60° and less than or equal to 120°.

<Structure of Oxide Semiconductor>

An oxide semiconductor is classified into a single crystal oxide semiconductor and a non-single-crystal oxide semiconductor.

An oxide semiconductor is classified into a single crystal oxide semiconductor and a non-single-crystal oxide semiconductor. Examples of a non-single-crystal oxide semiconductor include a c-axis aligned crystalline oxide semiconductor (CAAC-OS), a polycrystalline oxide semiconductor, a microcrystalline oxide semiconductor, and an amorphous oxide semiconductor.

From another perspective, an oxide semiconductor is classified into an amorphous oxide semiconductor and a crystalline oxide semiconductor. Examples of a crystalline oxide semiconductor include a single crystal oxide semiconductor, a CAAC-OS, a polycrystalline oxide semiconductor, and a microcrystalline oxide semiconductor.

<CAAC-OS>

First, a CAAC-OS is described. Note that a CAAC-OS can be referred to as an oxide semiconductor including c-axis aligned nanocrystals (CANC).

A CAAC-OS is one of oxide semiconductors having a plurality of c-axis aligned crystal parts (also referred to as pellets).

In a combined analysis image (also referred to as a high-resolution TEM image) of a bright-field image and a diffraction pattern of a CAAC-OS, which is obtained using a transmission electron microscope (TEM), a plurality of pellets can be observed. However, in the high-resolution TEM image, a boundary between pellets, that is, a grain boundary is not clearly observed. Thus, in the CAAC-OS, a reduction in electron mobility due to the grain boundary is less likely to occur.

A CAAC-OS observed with TEM is described below. FIG. 31A shows a high-resolution TEM image of a cross section of the CAAC-OS which is observed from a direction substantially parallel to the sample surface. The high-resolution TEM image is obtained with a spherical aberration corrector function. The high-resolution TEM image obtained with a spherical aberration corrector function is particularly referred to as a Cs-corrected high-resolution TEM image. The Cs-corrected high-resolution TEM image can be obtained with, for example, an atomic resolution analytical electron microscope JEM-ARM200F manufactured by JEOL Ltd.

FIG. 31B is an enlarged Cs-corrected high-resolution TEM image of a region (1) in FIG. 31A. FIG. 31B shows that metal atoms are arranged in a layered manner in a pellet. Each metal atom layer has a configuration reflecting unevenness of a surface over which the CAAC-OS is formed (hereinafter, the surface is referred to as a formation surface) or a top surface of the CAAC-OS, and is arranged parallel to the formation surface or the top surface of the CAAC-OS.

As shown in FIG. 31B, the CAAC-OS has a characteristic atomic arrangement. The characteristic atomic arrangement is denoted by an auxiliary line in FIG. 31C. FIGS. 31B and 31C prove that the size of a pellet is approximately 1 nm to 3 nm, and the size of a space caused by tilt of the pellets is approximately 0.8 nm. Therefore, the pellet can also be referred to as a nanocrystal (nc).

Here, according to the Cs-corrected high-resolution TEM images, the schematic arrangement of pellets 5100 of a CAAC-OS over a substrate 5120 is illustrated by such a structure in which bricks or blocks are stacked (see FIG. 31D). The part in which the pellets are tilted as observed in FIG. 31C corresponds to a region 5161 shown in FIG. 31D.

FIG. 32A shows a Cs-corrected high-resolution TEM image of a plane of the CAAC-OS observed from a direction substantially perpendicular to the sample surface. FIGS. 32B, 32C, and 32D are enlarged Cs-corrected high-resolution TEM images of regions (1), (2), and (3) in FIG. 32A, respectively. FIGS. 32B, 32C, and 32D indicate that metal atoms are arranged in a triangular, quadrangular, or hexagonal configuration in a pellet. However, there is no regularity of arrangement of metal atoms between different pellets.

Next, a CAAC-OS analyzed by X-ray diffraction (XRD) is described. For example, when the structure of a CAAC-OS including an InGaZnO₄ crystal is analyzed by an out-of-plane method, a peak appears at a diffraction angle (2θ) of around 31° as shown in FIG. 33A. This peak is derived from the (009) plane of the InGaZnO₄ crystal, which indicates that crystals in the CAAC-OS have c-axis alignment, and that the c-axes are aligned in a direction substantially perpendicular to the formation surface or the top surface of the CAAC-OS.

Note that in structural analysis of the CAAC-OS by an out-of-plane method, another peak may appear when 2θ is around 36°, in addition to the peak at 2θ of around 31°. The peak at 2θ of around 36° indicates that a crystal having no c-axis alignment is included in part of the CAAC-OS. It is preferable that in the CAAC-OS analyzed by an out-of-plane method, a peak appear when 2θ is around 31° and that a peak not appear when 2θ is around 36°.

On the other hand, in structural analysis of the CAAC-OS by an in-plane method in which an X-ray is incident on a sample in a direction substantially perpendicular to the c-axis, a peak appears when 28 is around 56°. This peak is attributed to the (110) plane of the InGaZnO₄ crystal. In the case of the CAAC-OS, when analysis (φ scan) is performed with 2θ fixed at around 56° and with the sample rotated using a normal vector of the sample surface as an axis (® axis), as shown in FIG. 33B, a peak is not clearly observed. In contrast, in the case of a single crystal oxide semiconductor of InGaZnO₄, when φ scan is performed with 2θ fixed at around 56°, as shown in FIG. 33C, six peaks which are derived from crystal planes equivalent to the (110) plane are observed. Accordingly, the structural analysis using XRD shows that the directions of a-axes and b-axes are different in the CAAC-OS.

Next, a CAAC-OS analyzed by electron diffraction is described. For example, when an electron beam with a probe diameter of 300 nm is incident on a CAAC-OS including an InGaZnO₄ crystal in a direction parallel to the sample surface, a diffraction pattern (also referred to as a selected-area transmission electron diffraction pattern) shown in FIG. 52A might be obtained. In this diffraction pattern, spots derived from the (009) plane of an InGaZnO₄ crystal are included. Thus, the electron diffraction also indicates that pellets included in the CAAC-OS have c-axis alignment and that the c-axes are aligned in a direction substantially perpendicular to the formation surface or the top surface of the CAAC-OS. Meanwhile, FIG. 52B shows a diffraction pattern obtained in such a manner that an electron beam with a probe diameter of 300 nm is incident on the same sample in a direction perpendicular to the sample surface. As shown in FIG. 52B, a ring-like diffraction pattern is observed. Thus, the electron diffraction also indicates that the a-axes and b-axes of the pellets included in the CAAC-OS do not have regular alignment. The first ring in FIG. 52B is considered to be derived from the (010) plane, the (100) plane, and the like of the InGaZnO₄ crystal. The second ring in FIG. 52B is considered to be derived from the (110) plane and the like.

Moreover, the CAAC-OS is an oxide semiconductor having a low density of defect states. Defects in the oxide semiconductor are, for example, a defect due to impurity and oxygen vacancies. Therefore, the CAAC-OS can be regarded as an oxide semiconductor with a low impurity concentration, or an oxide semiconductor having a small amount of oxygen vacancies.

The impurity contained in the oxide semiconductor might serve as a carrier trap or serve as a carrier generation source. Furthermore, oxygen vacancies in the oxide semiconductor serve as carrier traps or serve as carrier generation sources when hydrogen is captured therein.

Note that the impurity means an element other than the main components of the oxide semiconductor, such as hydrogen, carbon, silicon, or a transition metal element. For example, an element (specifically, silicon or the like) having higher strength of bonding to oxygen than a metal element included in an oxide semiconductor extracts oxygen from the oxide semiconductor, which results in disorder of the atomic arrangement and reduced crystallinity of the oxide semiconductor. A heavy metal such as iron or nickel, argon, carbon dioxide, or the like has a large atomic radius (or molecular radius), and thus disturbs the atomic arrangement of the oxide semiconductor and decreases crystallinity.

An oxide semiconductor having a low density of defect states (a small amount of oxygen vacancies) can have a low carrier density. Such an oxide semiconductor is referred to as a highly purified intrinsic or substantially highly purified intrinsic oxide semiconductor. A CAAC-OS has a low impurity concentration and a low density of defect states. That is, a CAAC-OS is likely to be a highly purified intrinsic or substantially highly purified intrinsic oxide semiconductor. Thus, a transistor including a CAAC-OS rarely has negative threshold voltage (is rarely normally on). The highly purified intrinsic or substantially highly purified intrinsic oxide semiconductor has few carrier traps. An electric charge trapped by the carrier traps in the oxide semiconductor takes a long time to be released. The trapped electric charge may behave like a fixed electric charge. Thus, the transistor which includes the oxide semiconductor having a high impurity concentration and a high density of defect states might have unstable electrical characteristics. However, a transistor including a CAAC-OS has small variation in electrical characteristics and high reliability.

The CAAC-OS having small amounts of impurities and oxygen vacancies is an oxide semiconductor with low carrier density (specifically, lower than 8×10¹¹/cm³, preferably lower than 1×10¹¹/cm³, further preferably lower than 1×10¹⁰/cm³, and is higher than or equal to 1×10⁻⁹/cm³). Such an oxide semiconductor is referred to as a highly purified intrinsic or substantially highly purified intrinsic oxide semiconductor. A CAAC-OS has a low impurity concentration and a low density of defect states. Thus, the CAAC-OS can be referred to as an oxide semiconductor having stable characteristics.

Since the CAAC-OS has a low density of defect states, carriers generated by light irradiation or the like are less likely to be trapped in defect states. Therefore, in a transistor using the CAAC-OS, change in electrical characteristics due to irradiation with visible light or ultraviolet light is small.

<Microcrystalline Oxide Semiconductor>

Next, a microcrystalline oxide semiconductor is described.

A microcrystalline oxide semiconductor has a region in which a crystal part is observed and a region in which a crystal part is not clearly observed in a high-resolution TEM image. In most cases, the size of a crystal part included in the microcrystalline oxide semiconductor is greater than or equal to 1 nm and less than or equal to 100 nm, or greater than or equal to 1 nm and less than or equal to 10 nm. An oxide semiconductor including a nanocrystal (nc) that is a microcrystal with a size greater than or equal to 1 nm and less than or equal to 10 nm, or a size greater than or equal to 1 nm and less than or equal to 3 nm is specifically referred to as a nanocrystalline oxide semiconductor (nc-OS). In a high-resolution TEM image of the nc-OS, for example, a grain boundary is not clearly observed in some cases. Note that there is a possibility that the origin of the nanocrystal is the same as that of a pellet in a CAAC-OS. Therefore, a crystal part of the nc-OS may be referred to as a pellet in the following description.

In the nc-OS, a microscopic region (for example, a region with a size greater than or equal to 1 nm and less than or equal to 10 nm, in particular, a region with a size greater than or equal to 1 nm and less than or equal to 3 nm) has a periodic atomic arrangement. There is no regularity of crystal orientation between different pellets in the nc-OS. Thus, the orientation of the whole film is not ordered. Accordingly, the nc-OS cannot be distinguished from an amorphous oxide semiconductor, depending on an analysis method. For example, when the nc-OS is subjected to structural analysis by an out-of-plane method with an XRD apparatus using an X-ray having a diameter larger than the size of a pellet, a peak which shows a crystal plane does not appear. Furthermore, a diffraction pattern like a halo pattern is observed when the nc-OS is subjected to electron diffraction using an electron beam with a probe diameter (e.g., 50 nm or larger) that is larger than the size of a pellet (the electron diffraction is also referred to as selected-area electron diffraction). Meanwhile, spots appear in a nanobeam electron diffraction pattern of the nc-OS when an electron beam having a probe diameter close to or smaller than the size of a pellet is applied. Moreover, in a nanobeam electron diffraction pattern of the nc-OS, regions with high luminance in a circular (ring) pattern are shown in some cases. Also in a nanobeam electron diffraction pattern of the nc-OS, a plurality of spots is shown in a ring-like region in some cases.

Since there is no regularity of crystal orientation between the pellets (nanocrystals) as mentioned above, the nc-OS can also be referred to as an oxide semiconductor including random aligned nanocrystals (RANC) or an oxide semiconductor including non-aligned nanocrystals (NANC).

The nc-OS is an oxide semiconductor that has high regularity as compared with an amorphous oxide semiconductor. Therefore, the nc-OS is likely to have a lower density of defect states than an amorphous oxide semiconductor. Note that there is no regularity of crystal orientation between different pellets in the nc-OS. Therefore, the nc-OS has a higher density of defect states than the CAAC-OS.

<Amorphous Oxide Semiconductor>

Next, an amorphous oxide semiconductor is described.

The amorphous oxide semiconductor is an oxide semiconductor having disordered atomic arrangement and no crystal part and exemplified by an oxide semiconductor which exists in an amorphous state as quartz.

In a high-resolution TEM image of the amorphous oxide semiconductor, crystal parts cannot be found.

When the amorphous oxide semiconductor is subjected to structural analysis by an out-of-plane method with an XRD apparatus, a peak which shows a crystal plane does not appear. A halo pattern is observed when the amorphous oxide semiconductor is subjected to electron diffraction. Furthermore, a spot is not observed and only a halo pattern appears when the amorphous oxide semiconductor is subjected to nanobeam electron diffraction.

There are various understandings of an amorphous structure. For example, a structure whose atomic arrangement does not have ordering at all is called a completely amorphous structure. Meanwhile, a structure which has ordering until the nearest neighbor atomic distance or the second-nearest neighbor atomic distance but does not have long-range ordering is also called an amorphous structure. Therefore, the strictest definition does not permit an oxide semiconductor to be called an amorphous oxide semiconductor as long as even a negligible degree of ordering is present in an atomic arrangement. At least an oxide semiconductor having long-term ordering cannot be called an amorphous oxide semiconductor. Accordingly, because of the presence of crystal part, for example, a CAAC-OS and an nc-OS cannot be called an amorphous oxide semiconductor or a completely amorphous oxide semiconductor.

<Amorphous-Like Oxide Semiconductor>

Note that an oxide semiconductor may have a structure intermediate between the nc-OS and the amorphous oxide semiconductor. The oxide semiconductor having such a structure is specifically referred to as an amorphous-like oxide semiconductor (a-like OS).

In a high-resolution TEM image of the a-like OS, a void may be observed. Furthermore, in the high-resolution TEM image, there are a region where a crystal part is clearly observed and a region where a crystal part is not observed.

The a-like OS has an unstable structure because it includes a void. To verify that an a-like OS has an unstable structure as compared with a CAAC-OS and an nc-OS, a change in structure caused by electron irradiation is described below.

An a-like OS (sample A), an nc-OS (sample B), and a CAAC-OS (sample C) are prepared as samples subjected to electron irradiation. Each of the samples is an In—Ga—Zn oxide.

First, a high-resolution cross-sectional TEM image of each sample is obtained. The high-resolution cross-sectional TEM images show that all the samples have crystal parts.

Note that which part is regarded as a crystal part is determined as follows. It is known that a unit cell of an InGaZnO₄ crystal has a structure in which nine layers including three In—O layers and six Ga—Zn—O layers are stacked in the c-axis direction. The distance between the adjacent layers is equivalent to the lattice spacing on the (009) plane (also referred to as d value). The value is calculated to be 0.29 nm from crystal structural analysis. Accordingly, a portion where the lattice spacing between lattice fringes is greater than or equal to 0.28 nm and less than or equal to 0.30 nm is regarded as a crystal part of InGaZnO₄. Each of lattice fringes corresponds to the a-b plane of the InGaZnOd₄ crystal.

FIG. 53 shows change in the average size of crystal parts (at 22 points to 45 points) in each sample. Note that the crystal part size corresponds to the length of a lattice fringe. FIG. 53 indicates that the crystal part size in the a-like OS increases with an increase in the cumulative electron dose. Specifically, as shown by (1) in FIG. 53, a crystal part of approximately 1.2 nm (also referred to as an initial nucleus) at the start of TEM observation grows to a size of approximately 2.6 nm at a cumulative electron dose of 4.2×10⁸ e⁻/nm². In contrast, the crystal part size in the nc-OS and the CAAC-OS shows little change from the start of electron irradiation to a cumulative electron dose of 4.2×10⁸ e⁻/nm². Specifically, as shown by (2) and (3) in FIG. 53, the average crystal sizes in an nc-OS and a CAAC-OS are approximately 1.4 nm and approximately 2.1 nm, respectively, regardless of the cumulative electron dose.

In this manner, growth of the crystal part in the a-like OS is induced by electron irradiation. In contrast, in the nc-OS and the CAAC-OS, growth of the crystal part is hardly induced by electron irradiation. Therefore, the a-like OS has an unstable structure as compared with the nc-OS and the CAAC-OS.

The a-like OS has a lower density than the nc-OS and the CAAC-OS because it includes a void. Specifically, the density of the a-like OS is higher than or equal to 78.6% and lower than 92.3% of the density of the single crystal oxide semiconductor having the same composition. The density of each of the nc-OS and the CAAC-OS is higher than or equal to 92.3% and lower than 100% of the density of the single crystal oxide semiconductor having the same composition. Note that it is difficult to deposit an oxide semiconductor having a density of lower than 78% of the density of the single crystal oxide semiconductor.

For example, in the case of an oxide semiconductor having an atomic ratio of In:Ga:Zn=1:1:1, the density of single crystal InGaZnO₄ with a rhombohedral crystal structure is 6.357 g/cm³. Accordingly, in the case of the oxide semiconductor having an atomic ratio of In:Ga:Zn=1:1:1, the density of the a-like OS is higher than or equal to 5.0 g/cm³ and lower than 5.9 g/cm³. For example, in the case of the oxide semiconductor having an atomic ratio of In:Ga:Zn=1:1:1, the density of each of the nc-OS and the CAAC-OS is higher than or equal to 5.9 g/cm³ and lower than 6.3 g/cm³.

Note that there is a possibility that an oxide semiconductor having a certain composition cannot exist in a single crystal structure. In that case, single crystal oxide semiconductors with different compositions are combined at an adequate ratio, which makes it possible to calculate density equivalent to that of a single crystal oxide semiconductor with the desired composition. The density of a single crystal oxide semiconductor having the desired composition can be calculated using a weighted average according to the combination ratio of the single crystal oxide semiconductors with different compositions. Note that it is preferable to use as few kinds of single crystal oxide semiconductors as possible to calculate the density.

As described above, oxide semiconductors have various structures and various properties. Note that an oxide semiconductor may be a stacked layer including two or more films of an amorphous oxide semiconductor, an a-like OS, a microcrystalline oxide semiconductor, and a CAAC-OS, for example.

The above oxide semiconductor can be used as the semiconductor 406 a, the semiconductor 406 b, the semiconductor 406 c, or the like.

Next, the other components of a semiconductor which can be used as the semiconductor 406 a, the semiconductor 406 b, the semiconductor 406 c, or the like are described.

The semiconductor 406 b is an oxide semiconductor containing indium, for example. An oxide semiconductor can have high carrier mobility (electron mobility) by containing indium, for example. The semiconductor 406 b preferably contains an element M. The element M is preferably aluminum, gallium, yttrium, tin, or the like. Other elements which can be used as the element M are boron, silicon, titanium, iron, nickel, germanium, yttrium, zirconium, molybdenum, lanthanum, cerium, neodymium, hafnium, tantalum, tungsten, and the like. Note that two or more of the above elements may be used in combination as the element M. The element M is an element having high bonding energy with oxygen, for example. The element M is an element whose bonding energy with oxygen is higher than that of indium. The element M is an element that can increase the energy gap of the oxide semiconductor, for example. Furthermore, the semiconductor 406 b preferably contains zinc. When the oxide semiconductor contains zinc, the oxide semiconductor is easily to be crystallized, for example.

Note that the semiconductor 406 b is not limited to the oxide semiconductor containing indium. The semiconductor 406 b may be, for example, an oxide semiconductor which does not contain indium and contains zinc, an oxide semiconductor which does not contain indium and contains gallium, or an oxide semiconductor which does not contain indium and contains tin, e.g., a zinc tin oxide or a gallium tin oxide.

For the semiconductor 406 b, an oxide with a wide energy gap may be used. For example, the energy gap of the semiconductor 406 b is greater than or equal to 2.5 eV and less than or equal to 4.2 eV, preferably greater than or equal to 2.8 eV and less than or equal to 3.8 eV, more preferably greater than or equal to 3 eV and less than or equal to 3.5 eV.

For example, the semiconductor 406 a and the semiconductor 406 c include one or more elements other than oxygen included in the semiconductor 406 b. Since the semiconductor 406 a and the semiconductor 406 c each include one or more elements other than oxygen included in the semiconductor 406 b, an interface state is less likely to be formed at the interface between the semiconductor 406 a and the semiconductor 406 b and the interface between the semiconductor 406 b and the semiconductor 406 c.

The semiconductor 406 a, the semiconductor 406 b, and the semiconductor 406 c preferably include at least indium. In the case of using an In-M-Zn oxide as the semiconductor 406 a, when summation of In and M is assumed to be 100 atomic %, the proportions of In and M are preferably set to be less than 50 atomic % and greater than 50 atomic %, respectively, more preferably less than 25 atomic % and greater than 75 atomic %, respectively. In the case of using an In-M-Zn oxide as the semiconductor 406 b, when summation of In and M is assumed to be 100 atomic %, the proportions of In and M are preferably set to be greater than 25 atomic % and less than 75 atomic %, respectively, more preferably greater than 34 atomic % and less than 66 atomic %, respectively. In the case of using an In-M-Zn oxide as the semiconductor 406 c, when summation of In and M is assumed to be 100 atomic %, the proportions of In and M are preferably set to be less than 50 atomic % and greater than 50 atomic %, respectively, more preferably less than 25 atomic % and greater than 75 atomic %, respectively. Note that the semiconductor 406 c may be an oxide that is a type the same as that of the semiconductor 406 a.

As the semiconductor 406 b, an oxide having an electron affinity higher than those of the semiconductors 406 a and 406 c is used. For example, as the semiconductor 406 b, an oxide having an electron affinity higher than those of the semiconductors 406 a and 406 c by 0.07 eV or higher and 1.3 eV or lower, preferably 0.1 eV or higher and 0.7 eV or lower, more preferably 0.15 eV or higher and 0.4 eV or lower is used. Note that the electron affinity refers to an energy difference between the vacuum level and the bottom of the conduction band.

An indium gallium oxide has a small electron affinity and a high oxygen-blocking property. Therefore, the semiconductor 406 c preferably includes an indium gallium oxide. The gallium atomic ratio [Ga/(In+Ga)] is, for example, higher than or equal to 70%, preferably higher than or equal to 80%, more preferably higher than or equal to 90%.

At this time, when a gate voltage is applied, a channel is formed in the semiconductor 406 b having the highest electron affinity in the semiconductor 406 a, the semiconductor 406 b, and the semiconductor 406 c.

FIG. 3A is a band diagram taken along dashed-dotted line E1-E2 in FIG. 2. FIG. 3A shows a vacuum level (denoted by vacuum level), and an energy of the bottom of the conduction band (denoted by Ec) and an energy of the top of the valence band (denoted by Ev) of each of the layers.

Here, in some cases, there is a mixed region of the semiconductor 406 a and the semiconductor 406 b between the semiconductor 406 a and the semiconductor 406 b. Furthermore, in some cases, there is a mixed region of the semiconductor 406 b and the semiconductor 406 c between the semiconductor 406 b and the semiconductor 406 c. The mixed region has a low interface state density. For that reason, the stack of the semiconductor 406 a, the semiconductor 406 b, and the semiconductor 406 c has a band diagram where energy at each interface and in the vicinity of the interface is changed continuously (continuous junction).

At this time, electrons move mainly in the semiconductor 406 b, not in the semiconductor 406 a and the semiconductor 406 c (see FIG. 3B). As described above, when the interface state density at the interface between the semiconductor 406 a and the semiconductor 406 b and the interface state density at the interface between the semiconductor 406 b and the semiconductor 406 c are decreased, electron movement in the semiconductor 406 b is less likely to be inhibited and the on-sate current of the transistor can be increased.

As factors of inhibiting electron movement are decreased, the on-state current of the transistor can be increased. For example, in the case where there is no factor of inhibiting electron movement, electrons are assumed to be efficiently moved as illustrated in FIG. 4A. Electron movement is inhibited, for example, in the case where physical unevenness is large as illustrated in FIG. 4B.

Therefore, to increase the on-state current of the transistor, for example, root mean square (RMS) roughness with a measurement area of 1 μm×1 μm of a top surface or a bottom surface of the semiconductor 406 b (a formation surface; here, the semiconductor 406 a) is less than 1 nm, preferably less than 0.6 nm, more preferably less than 0.5 nm, still more preferably less than 0.4 nm. The average surface roughness (also referred to as Ra) with the measurement area of 1 μm×1 μm is less than 1 nm, preferably less than 0.6 nm, more preferably less than 0.5 nm, still more preferably less than 0.4 nm. The maximum difference (P−V) with the measurement area of 1 μm×1 μm is less than 10 nm, preferably less than 9 nm, more preferably less than 8 nm, still more preferably less than 7 nm. RMS roughness, Ra, and P−V can be measured using a scanning probe microscope SPA-500 manufactured by SII Nano Technology Inc.

The electron movement is also inhibited, for example, in the case where the density of defect states is high in a region where a channel is formed as illustrated in FIG. 4C.

For example, in the case were the semiconductor 406 b contains oxygen vacancies (also denoted by V_(O)), donor levels are formed by entry of hydrogen into sites of oxygen vacancies in some cases. A state in which hydrogen enters sites of oxygen vacancies are denoted by V_(O)H in the following description in some cases. V_(O)H is a factor of decreasing the on-state current of the transistor because V_(O)H scatters electrons. Note that sites of oxygen vacancies become more stable by entry of oxygen than by entry of hydrogen. Thus, by decreasing oxygen vacancies in the semiconductor 406 b, the on-state current of the transistor can be increased in some cases.

To decrease oxygen vacancies in the semiconductor 406 b, for example, there is a method in which excess oxygen in the insulator 402 is moved to the semiconductor 406 b through the semiconductor 406 a. In this case, the semiconductor 406 a is preferably a layer having an oxygen-transmitting property (a layer through which oxygen passes or is transmitted).

Oxygen is released from the insulator 402 and taken into the semiconductor 406 a by heat treatment or the like. In some cases, oxygen exists and is apart from atomics in the semiconductor 406 a, or exists and is bonded to oxygen or the like. As the density becomes lower, i.e., the number of spaces between the atoms becomes larger, the semiconductor 406 a has a higher oxygen-transmitting property. For example, in the case where the semiconductor 406 a has a layered crystal structure and oxygen movement in which oxygen crosses the layer is less likely to occur, the semiconductor 406 a is preferably a layer having low crystallinity as appropriate.

A relationship between crystallinity and an oxygen-transmitting property in the case where the semiconductor 406 a is an In—Ga—Zn oxide is described below.

An energy barrier due to movement of excess oxygen (oxygen) in a crystal of an In—Ga—Zn oxide is obtained by calculation. In the calculation, plane-wave basis first-principles calculation software Vienna ab-initio simulation package (VASP) based on density functional theory is used. GGA-PBE is used as a functional. Cut-off energy of a plane wave is 400 eV. The effect of an inner shell electron is included by a projector augmented wave (PAW) method.

Here, the ease of movement of excess oxygen (oxygen) through movement paths 1 to 4 in a crystal of an In—Ga—Zn oxide illustrated in FIG. 34 is calculated.

The movement path 1 is a path through which excess oxygen (oxygen) bonded to oxygen bonded to three indium atoms and one zinc atom is bonded to adjacent oxygen bonded to three indium atoms and one zinc atom. The movement path 2 is a path through which excess oxygen (oxygen) bonded to oxygen bonded to three indium atoms and one gallium atom crosses a layer containing indium and oxygen and is bonded to adjacent oxygen bonded to three indium atoms and one zinc atom. The movement path 3 is a path through which excess oxygen (oxygen) bonded to oxygen bonded to two gallium atoms and one zinc atom is bonded to adjacent oxygen bonded to two zinc atoms and one gallium atom. The movement path 4 is a path through which excess oxygen (oxygen) bonded to oxygen bonded to two gallium atoms and one zinc atom crosses a layer containing gallium, zinc, and oxygen and is bonded to adjacent oxygen bonded to three indium atoms and one gallium atom.

When the frequency of going over an energy barrier E_(a) per unit time is referred to as a diffusion frequency R, R can be expressed as the following formula.

R=ν·exp[−E _(a)/(k _(B) T)]

Note that ν represents the number of heat vibrations of diffusion atoms, k_(B) represents Boltzmann constant, and T represents the absolute temperature. The diffusion frequency R at 350° C. and 450° C. when 10¹³[1/sec] is applied to ν as Debye frequency is shown in Table 1.

TABLE 1 Energy barrier Diffusion frequency R [1/sec] [eV] 350° C. 450° C. Movement path 1 0.50 9.0 × 10⁸ 3.3 × 10⁹ Movement path 2 1.97  1.2 × 10⁻³  1.9 × 10⁻¹ Movement path 3 0.53 5.2 × 10⁸ 2.0 × 10⁹ Movement path 4 0.56 3.0 × 10⁸ 1.3 × 10⁹

As shown in Table 1, the movement path 2 across the layer containing indium and oxygen has a higher energy barrier than the other movement paths. This indicates that movement of excess oxygen (oxygen) in the c-axis direction is less likely to occur in a crystal of an In—Ga—Zn oxide. In other words, in the case where crystals have c-axis alignment and the c-axes are aligned in a direction substantially perpendicular to a formation surface or a top surface, like CAAC-OS, movement of excess oxygen (oxygen) is less likely to occur in the direction substantially perpendicular to the formation surface or the top surface.

As described above, the semiconductor 406 a preferably has crystallinity such that excess oxygen (oxygen) is transmitted so that excess oxygen (oxygen) released from the insulator 402 reaches the semiconductor 406 b. For example, in the case where the semiconductor 406 a is a CAAC-OS, a structure in which a space is partly provided in the layer is preferably employed because when the whole layer becomes CAAC, excess oxygen (oxygen) cannot be transmitted. For example, the proportion of CAAC of the semiconductor 406 a is lower than 100%, preferably lower than 98%, more preferably lower than 95%, still more preferably lower than 90%. Note that to reduce the interface state density at the interface between the semiconductor 406 a and the semiconductor 406 b, the proportion of CAAC of the semiconductor 406 a is higher than or equal to 10%, preferably higher than or equal to 20%, more preferably higher than or equal to 50%, still more preferably higher than or equal to 70%.

In the case where the transistor has an s-channel structure, a channel is formed in the whole of the semiconductor 406 b. Therefore, as the semiconductor 406 b has a larger thickness, a channel region becomes larger. In other words, the thicker the semiconductor 406 b is, the larger the on-state current of the transistor is. For example, the semiconductor 406 b has a region with a thickness of greater than or equal to 20 nm, preferably greater than or equal to 40 nm, more preferably greater than or equal to 60 nm, still more preferably greater than or equal to 100 nm. Note that the semiconductor 406 b has a region with a thickness of, for example, less than or equal to 300 nm, preferably less than or equal to 200 nm, more preferably less than or equal to 150 nm because the productivity of the semiconductor device might be decreased.

Moreover, the thickness of the semiconductor 406 c is preferably as small as possible to increase the on-state current of the transistor. The thickness of the semiconductor 406 c is less than 10 nm, preferably less than or equal to 5 nm, more preferably less than or equal to 3 nm, for example. Meanwhile, the semiconductor 406 c has a function of blocking entry of elements other than oxygen (such as hydrogen and silicon) included in the adjacent insulator into the semiconductor 406 b where a channel is formed. For this reason, it is preferable that the semiconductor 406 c have a certain thickness. The thickness of the semiconductor 406 c is greater than or equal to 0.3 nm, preferably greater than or equal to 1 nm, more preferably greater than or equal to 2 nm, for example. The semiconductor 406 c preferably has an oxygen blocking property to suppress outward diffusion of oxygen released from the insulator 402 and the like.

To improve reliability, preferably, the thickness of the semiconductor 406 a is large and the thickness of the semiconductor 406 c is small. For example, the semiconductor 406 a has a region with a thickness of, for example, greater than or equal to 10 nm, preferably greater than or equal to 20 nm, more preferably greater than or equal to 40 nm, still more preferably greater than or equal to 60 nm. When the thickness of the semiconductor 406 a is made large, a distance from an interface between the adjacent insulator and the semiconductor 406 a to the semiconductor 406 b in which a channel is formed can be large. Since the productivity of the semiconductor device might be decreased, the semiconductor 406 a has a region with a thickness of, for example, less than or equal to 200 nm, preferably less than or equal to 120 nm, more preferably less than or equal to 80 nm.

For example, a region with a silicon concentration of lower than 1×10¹⁹ atoms/cm³, preferably lower than 5×10¹⁸ atoms/cm³, more preferably lower than 2×10¹⁸ atoms/cm³ which is measured by secondary ion mass spectrometry (SIMS) is provided between the semiconductor 406 b and the semiconductor 406 a. A region with a silicon concentration of lower than 1×10¹⁹ atoms/cm³, preferably lower than 5×10¹⁸ atoms/cm³, more preferably lower than 2×10¹⁸ atoms/cm³ which is measured by SIMS is provided between the semiconductor 406 b and the semiconductor 406 c.

It is preferable to reduce the concentration of hydrogen in the semiconductor 406 a and the semiconductor 406 c in order to reduce the concentration of hydrogen in the semiconductor 406 b. The semiconductor 406 a and the semiconductor 406 c each have a region in which the concentration of hydrogen measured by SIMS is lower than or equal to 2×10²⁰ atoms/cm³, preferably lower than or equal to 5×10¹⁹ atoms/cm³, more preferably lower than or equal to 1×10¹⁹ atoms/cm³, still more preferably lower than or equal to 5×10¹⁸ atoms/cm³. It is preferable to reduce the concentration of nitrogen in the semiconductor 406 a and the semiconductor 406 c in order to reduce the concentration of nitrogen in the semiconductor 406 b. The semiconductor 406 a and the semiconductor 406 c each have a region in which the concentration of nitrogen measured by SIMS is lower than 5×10¹⁹ atoms/cm³, preferably lower than or equal to 5×10¹⁸ atoms/cm³, more preferably lower than or equal to 1×10¹⁸ atoms/cm³, still more preferably lower than or equal to 5×10¹⁷ atoms/cm³.

The above three-layer structure is an example. For example, a two-layer structure without the semiconductor 406 a or the semiconductor 406 c may be employed. A four-layer structure in which any one of the semiconductors described as examples of the semiconductor 406 a, the semiconductor 406 b, and the semiconductor 406 c is provided below or over the semiconductor 406 a or below or over the semiconductor 406 c may be employed. An n-layer structure (n is an integer of 5 or more) in which any one of the semiconductors described as examples of the semiconductor 406 a, the semiconductor 406 b, and the semiconductor 406 c is provided at two or more of the following positions: over the semiconductor 406 a, below the semiconductor 406 a, over the semiconductor 406 c, and below the semiconductor 406 c.

At least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided on at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b.

Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is in contact with at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b. Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is in contact with at least part (or all) of a semiconductor, e.g., the semiconductor 406 b.

Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is electrically connected to at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b. Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is electrically connected to at least part (or all) of a semiconductor, e.g., the semiconductor 406 b.

Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided near at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b. Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided near at least part (or all) of a semiconductor, e.g., the semiconductor 406 b.

Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided to be adjacent to at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b. Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided to be adjacent to at least part (or all) of a semiconductor, e.g., the semiconductor 406 b.

Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided obliquely above at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b. Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided obliquely above at least part (or all) of a semiconductor, e.g., the semiconductor 406 b.

Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided above at least part (or all) of a surface, a side surface, a top surface, and/or a bottom surface of a semiconductor, e.g., the semiconductor 406 b. Alternatively, at least part (or all) of the conductor 416 a (and/or the conductor 416 b) is provided above at least part (or all) of a semiconductor, e.g., the semiconductor 406 b.

As the substrate 400, an insulator substrate, a semiconductor substrate, or a conductor substrate may be used, for example. As the insulator substrate, a glass substrate, a quartz substrate, a sapphire substrate, a stabilized zirconia substrate (e.g., an yttria-stabilized zirconia substrate), or a resin substrate is used, for example. As the semiconductor substrate, a single material semiconductor substrate of silicon, germanium, or the like or a compound semiconductor substrate of silicon carbide, silicon germanium, gallium arsenide, indium phosphide, zinc oxide, gallium oxide, or the like is used, for example. A semiconductor substrate in which an insulator region is provided in the above semiconductor substrate, e.g., a silicon on insulator (SOI) substrate or the like is used. As the conductor substrate, a graphite substrate, a metal substrate, an alloy substrate, a conductive resin substrate, or the like is used. A substrate including a metal nitride, a substrate including a metal oxide, or the like is used. An insulator substrate provided with a conductor or a semiconductor, a semiconductor substrate provided with a conductor or an insulator, a conductor substrate provided with a semiconductor or an insulator, or the like is used. Alternatively, any of these substrates over which an element is provided may be used. As the element provided over the substrate, a capacitor, a resistor, a switching element, a light-emitting element, a memory element, or the like is used.

Alternatively, a flexible substrate may be used as the substrate 400. As a method for providing a transistor over a flexible substrate, there is a method in which the transistor is formed over a non-flexible substrate and then the transistor is separated and transferred to the substrate 400 which is a flexible substrate. In that case, a separation layer is preferably provided between the non-flexible substrate and the transistor. As the substrate 400, a sheet, a film, or a foil containing a fiber may be used. The substrate 400 may have elasticity. The substrate 400 may have a property of returning to its original shape when bending or pulling is stopped. Alternatively, the substrate 400 may have a property of not returning to its original shape. The substrate 400 has a region with a thickness of, for example, greater than or equal to 5 μm and less than or equal to 700 μm, preferably greater than or equal to 10 μm and less than or equal to 500 μm, more preferably greater than or equal to 15 μm and less than or equal to 300 μm. When the substrate 400 has a small thickness, the weight of the semiconductor device can be reduced. When the substrate 400 has a small thickness, even in the case of using glass or the like, the substrate 400 may have elasticity or a property of returning to its original shape when bending or pulling is stopped. Therefore, an impact applied to the semiconductor device over the substrate 400, which is caused by dropping or the like, can be reduced. That is, a durable semiconductor device can be provided.

For the substrate 400 which is a flexible substrate, metal, an alloy, resin, glass, or fiber thereof can be used, for example. The flexible substrate 400 preferably has a lower coefficient of linear expansion because deformation due to an environment is suppressed. The flexible substrate 400 is formed using, for example, a material whose coefficient of linear expansion is lower than or equal to 1×10⁻³/K, lower than or equal to 5×10⁻⁵/K, or lower than or equal to 1×10⁻⁵/K. Examples of the resin include polyester, polyolefin, polyamide (e.g., nylon or aramid), polyimide, polycarbonate, and acrylic. In particular, aramid is preferably used for the flexible substrate 400 because of its low coefficient of linear expansion.

The conductor 413 may be formed to have a single-layer structure or a stacked-layer structure using a conductor containing one or more kinds of boron, nitrogen, oxygen, fluorine, silicon, phosphorus, aluminum, titanium, chromium, manganese, cobalt, nickel, copper, zinc, gallium, yttrium, zirconium, molybdenum, ruthenium, silver, indium, tin, tantalum, and tungsten, for example. An alloy or a compound containing the above element may be used, for example, and a conductor containing aluminum, a conductor containing copper and titanium, a conductor containing copper and manganese, a conductor containing indium, tin, and oxygen, a conductor containing titanium and nitrogen, or the like may be used.

The insulator 402 may be formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing boron, carbon, nitrogen, oxygen, fluorine, magnesium, aluminum, silicon, phosphorus, chlorine, argon, gallium, germanium, yttrium, zirconium, lanthanum, neodymium, hafnium, or tantalum. Note that the insulator 402 may include an insulator containing nitrogen such as silicon nitride oxide or silicon nitride.

The insulator 402 may have a function of preventing diffusion of impurities from the substrate 400. In the case where the semiconductor 406 b is an oxide semiconductor, the insulator 402 can have a function of supplying oxygen to the semiconductor 406 b.

Each of the conductor 416 a and the conductor 416 b may be formed to have, for example, a single-layer structure or a stacked-layer structure including a conductor containing one or more kinds of boron, nitrogen, oxygen, fluorine, silicon, phosphorus, aluminum, titanium, chromium, manganese, cobalt, nickel, copper, zinc, gallium, yttrium, zirconium, molybdenum, ruthenium, silver, indium, tin, tantalum, and tungsten. An alloy or a compound containing the above element may be used, for example, and a conductor containing aluminum, a conductor containing copper and titanium, a conductor containing copper and manganese, a conductor containing indium, tin, and oxygen, a conductor containing titanium and nitrogen, or the like may be used.

The insulator 412 may be formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing boron, carbon, nitrogen, oxygen, fluorine, magnesium, aluminum, silicon, phosphorus, chlorine, argon, gallium, germanium, yttrium, zirconium, lanthanum, neodymium, hafnium, or tantalum.

The conductor 404 may be formed to have, for example, a single-layer structure or a stacked-layer structure including a conductor containing one or more kinds of boron, nitrogen, oxygen, fluorine, silicon, phosphorus, aluminum, titanium, chromium, manganese, cobalt, nickel, copper, zinc, gallium, yttrium, zirconium, molybdenum, ruthenium, silver, indium, tin, tantalum, and tungsten. An alloy or a compound containing the above element may be used, for example, and a conductor containing aluminum, a conductor containing copper and titanium, a conductor containing copper and manganese, a conductor containing indium, tin, and oxygen, a conductor containing titanium and nitrogen, or the like may be used.

The insulator 408 may be formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing boron, carbon, nitrogen, oxygen, fluorine, magnesium, aluminum, silicon, phosphorus, chlorine, argon, gallium, germanium, yttrium, zirconium, lanthanum, neodymium, hafnium, or tantalum. The insulator 408 may be preferably formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing aluminum oxide, silicon nitride oxide, silicon nitride, gallium oxide, yttrium oxide, zirconium oxide, lanthanum oxide, neodymium oxide, hafnium oxide, or tantalum oxide.

The insulator 418 may be formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing boron, carbon, nitrogen, oxygen, fluorine, magnesium, aluminum, silicon, phosphorus, chlorine, argon, gallium, germanium, yttrium, zirconium, lanthanum, neodymium, hafnium, or tantalum. The insulator 418 may be preferably formed to have a single-layer structure or a stacked-layer structure including an insulator containing silicon oxide or silicon oxynitride.

Although FIGS. 1A and 1B show an example where the conductor 404 which is a first gate electrode of a transistor is not electrically connected to the conductor 413 which is a second gate electrode, a transistor structure of one embodiment of the present invention is not limited thereto. For example, as illustrated in FIG. 5A, the conductor 404 may be in contact with the conductor 413. With such a structure, the conductor 404 and the conductor 413 are supplied with the same potential; thus, switching characteristics of the transistor can be improved. Alternatively, as illustrated in FIG. 5B, the conductor 413 is not necessarily provided.

FIG. 6A is an example of a top view of a transistor. FIG. 6B is an example of a cross-sectional view taken along dashed-dotted line B1-B2 and dashed-dotted line B3-B4 in FIG. 6A. Note that some components such as an insulator are omitted in FIG. 6A for easy understanding.

FIG. 7A is an example of a top view of a transistor. FIG. 7B is an example of a cross-sectional view taken along dashed-dotted line C1-C2 and dashed-dotted line C3-C4 in FIG. 7A. Note that some components such as an insulator are omitted in FIG. 7A for easy understanding.

FIG. 8A is an example of a top view of a transistor. FIG. 8B is an example of a cross-sectional view taken along dashed-dotted line D1-D2 and dashed-dotted line D3-D4 in FIG. 8A. Note that some components such as an insulator are omitted in FIG. 8A for easy understanding.

Although FIGS. 1A and 1B show an example where the semiconductor 406 c, the insulator 412, and the conductor 404 have similar shapes in FIG. 1A which is a top view, that is, any of the ends does not project in FIG. 1B which is a cross-sectional view, a transistor structure of one embodiment of the present invention is not limited thereto. For example, as illustrated in the top view in FIG. 6A and the cross-sectional view in FIG. 6B, the semiconductor 406 c and the insulator 412 may be formed over the entire surface of the transistor. As illustrated in the top view in FIG. 7A, the semiconductor 406 c may be provided to cover a channel formation region of a transistor and its periphery, and the insulator 412 may be provided over the entire surface of the transistor to cover the semiconductor 406 c. In the cross-sectional view in FIG. 7B, the semiconductor 406 c has a region whose end projects as compared with the conductor 404. Alternatively, as illustrated in the top view in FIG. 8A, the semiconductor 406 c and the insulator 412 may be provided to cover a channel formation region of a transistor and its periphery. Note that in the cross-sectional view in FIG. 8B, the semiconductor 406 c and the insulator 412 each have a region whose end projects as compared with the conductor 404.

When the transistor has any one of the structures illustrated in FIGS. 6A and 6B, FIGS. 7A and 7B, and FIGS. 8A and 8B, leakage current through a surface of the semiconductor 406 c, a surface of the insulator 412, or the like can be reduced in some cases. In other words, the off-state current of the transistor can be reduced. At the time of etching of the insulator 412 and the semiconductor 406 c, the conductor 404 is not necessarily used as a mask; thus, the conductor 404 is not exposed to plasma. Therefore, electrostatic damage of a transistor due to an antenna effect is less likely to occur, and thus, the semiconductor device can be manufactured with high yield. Since the degree of freedom of design of the semiconductor device is increased, the transistor is suitable for an integrated circuit such as a large scale integration (LSI) or very large scale integration (VLSI) having a complicated structure.

FIG. 9A is an example of a top view of a transistor. FIG. 9B is an example of a cross-sectional view taken along dashed-dotted line F1-F2 and dashed-dotted line F3-F4 in FIG. 9A. Note that some components such as an insulator are omitted in FIG. 9A for easy understanding.

Although FIGS. 1A and 1B and the like show a structure in which a region where the conductors 416 a and 416 b functioning as a source electrode and a drain electrode and the conductor 404 functioning as a gate electrode overlap with each other is provided, a transistor structure of one embodiment of the present invention is not limited thereto. For example, as illustrated in FIGS. 9A and 9B, a region where the conductors 416 a and 416 b and the conductor 404 overlap with each other is not necessarily provided. With such a structure, a transistor with a small parasitic capacitance can be formed. Thus, a transistor with favorable switching characteristics and less noise can be obtained.

Note that the conductors 416 a and 416 b and the conductor 404 do not overlap with each other; thus, resistance between the conductor 416 a and the conductor 416 b becomes high in some cases. In such a case, the resistance is preferably as low as possible because the on-state current of the transistor might be low. For example, the distance between the conductor 416 a (conductor 416 b) and the conductor 404 may be made small. For example, the distance between the conductor 416 a (conductor 416 b) and the conductor 404 may be greater than or equal to 0 μm and less than or equal to 1 μm, preferably greater than or equal to 0 μm and less than or equal to 0.5 μm, more preferably greater than or equal to 0 μm and less than or equal to 0.2 μm, still more preferably greater than or equal to 0 μm and less than or equal to 0.1 μm.

A low-resistance region 423 a (low-resistance region 423 b) may be provided in the semiconductor 406 b and/or the semiconductor 406 a between the conductor 416 a (conductor 416 b) and the conductor 404. The low-resistance region 423 a and the low-resistance region 423 b each have, for example, a region whose carrier density is higher than that of the other region of the semiconductor 406 b and/or that of the other region of the semiconductor 406 a. Alternatively, the low-resistance region 423 a and the low-resistance region 423 b each have a region whose impurity concentration is higher than that of the other region of the semiconductor 406 b and/or that of the other region of the semiconductor 406 a. Alternatively, the low-resistance region 423 a and the low-resistance region 423 b each have a region whose carrier mobility is higher than that of the other region of the semiconductor 406 b and/or that of the other region of the semiconductor 406 a. The low-resistance region 423 a and the low-resistance region 423 b may be formed in such a manner that, for example, the conductor 404, the conductor 416 a, the conductor 416 b, and the like are used as masks and impurities are added to the semiconductor 406 b and/or the semiconductor 406 a.

The distance between the conductor 416 a (conductor 416 b) and the conductor 404 may be made short, and the low-resistance region 423 a (low-resistance region 423 b) may be provided in the semiconductor 406 b and/or the semiconductor 406 a between the conductor 416 a (conductor 416 b) and the conductor 404.

FIG. 10A is an example of a top view of a transistor. FIG. 10B is an example of a cross-sectional view taken along dashed-dotted line G1-G2 and dashed-dotted line G3-G4 in FIG. 10A. Note that some components such as an insulator are omitted in FIG. 10A for easy understanding.

Although FIGS. 1A and 1B and the like show an example where the conductor 416 a and the conductor 416 b which function as a source electrode and a drain electrode are in contact with a top surface and a side surface of the semiconductor 406 b, a top surface of the insulator 402, and the like, a transistor structure of one embodiment of the present invention is not limited thereto. For example, as illustrated in FIGS. 10A and 10B, the conductor 416 a and the conductor 416 b may be in contact with only the top surface of the semiconductor 406 b.

As illustrated in FIG. 10B, an insulator 428 may be provided over the insulator 418. The insulator 428 preferably has a flat top surface. The insulator 428 may be formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing boron, carbon, nitrogen, oxygen, fluorine, magnesium, aluminum, silicon, phosphorus, chlorine, argon, gallium, germanium, yttrium, zirconium, lanthanum, neodymium, hafnium, or tantalum. Note that the insulator 428 may include an insulator containing nitrogen such as silicon nitride oxide or silicon nitride. To planarize the top surface of the insulator 428, planarization treatment may be performed by a chemical mechanical polishing (CMP) method or the like.

A resin may be used as the insulator 428. For example, a resin containing polyimide, polyamide, acrylic, silicone, or the like may be used. The use of a resin does not need planarization treatment performed on the top surface of the insulator 428 in some cases. By using a resin, a thick film can be formed in a short time; thus, the productivity can be increased.

As illustrated in FIGS. 10A and 10B, a conductor 424 a and a conductor 424 b may be provided over the insulator 428. The conductor 424 a and the conductor 424 b may function as wirings, for example. The insulator 428 may include an opening and the conductor 416 a and the conductor 424 a may be electrically connected to each other through the opening. The insulator 428 may have another opening and the conductor 416 b and the conductor 424 b may be electrically connected to each other through the opening. In this case, the conductor 426 a and the conductor 426 b may be provided in the respective openings.

Each of the conductor 424 a and the conductor 424 b may be formed to have, for example, a single-layer structure or a stacked-layer structure including a conductor containing one or more kinds of boron, nitrogen, oxygen, fluorine, silicon, phosphorus, aluminum, titanium, chromium, manganese, cobalt, nickel, copper, zinc, gallium, yttrium, zirconium, molybdenum, ruthenium, silver, indium, tin, tantalum, and tungsten. An alloy or a compound containing the above element may be used, for example, and a conductor containing aluminum, a conductor containing copper and titanium, a conductor containing copper and manganese, a conductor containing indium, tin, and oxygen, a conductor containing titanium and nitrogen, or the like may be used.

In the transistor illustrated in FIGS. 10A and 10B, the conductor 416 a and the conductor 416 b are not in contact with side surfaces of the semiconductor 406 b. Thus, an electric field applied from the conductor 404 functioning as a first gate electrode to the side surfaces of the semiconductor 406 b is less likely to be blocked by the conductor 416 a and the conductor 416 b. The conductor 416 a and the conductor 416 b are not in contact with a top surface of the insulator 402. Thus, excess oxygen (oxygen) released from the insulator 402 is not consumed to oxidize the conductor 416 a and the conductor 416 b. Accordingly, excess oxygen (oxygen) released from the insulator 402 can be efficiently used to reduce oxygen vacancies in the semiconductor 406 b. In other words, the transistor having the structure illustrated in FIGS. 10A and 10B has excellent electrical characteristics such as a high on-state current, high field-effect mobility, a small subthreshold swing value, and high reliability.

FIG. 11A is an example of a top view of a transistor. FIG. 11B is an example of a cross-sectional view taken along dashed-dotted line H1-H2 and dashed-dotted line H3-H4 in FIG. 11A. Note that some components such as an insulator are omitted in FIG. 11A for easy understanding.

The transistor may have a structure in which, as illustrated in FIGS. 11A and 11B, the conductor 416 a and the conductor 416 b are not provided and the conductor 426 a and the conductor 426 b are in contact with the semiconductor 406 b. In this case, the low-resistance region 423 a (low-resistance region 423 b) is preferably provided in a region in contact with at least the conductor 426 a and the conductor 426 b in the semiconductor 406 b and/or the semiconductor 406 a. The low-resistance region 423 a and the low-resistance region 423 b may be formed in such a manner that, for example, the conductor 404 and the like are used as masks and impurities are added to the semiconductor 406 b and/or the semiconductor 406 a. The conductor 426 a and the conductor 426 b may be provided in holes (portions which penetrate) or recessed portions (portions which do not penetrate) of the semiconductor 406 b. When the conductor 426 a and the conductor 426 b are provided in holes or recessed portions of the semiconductor 406 b, contact areas between the conductors 426 a and 426 b and the semiconductor 406 b are increased; thus, the adverse effect of the contact resistance can be decreased. In other words, the on-state current of the transistor can be increased.

<Method for Manufacturing Transistor Structure 1>

Next, a method for manufacturing the transistor illustrated in FIGS. 1A and 1B is described.

First, the substrate 400 is prepared.

Next, a conductor to be the conductor 413 is formed. The conductor to be the conductor 413 may be formed by a sputtering method, a chemical vapor deposition (CVD) method, a molecular beam epitaxy (MBE) method, a pulsed laser deposition (PLD) method, or an atomic layer deposition (ALD) method.

The CVD method can include a plasma enhanced CVD (PECVD) method using plasma, a thermal CVD (TCVD) method using heat, and the like. Moreover, the CVD method can include a metal CVD (MCVD) method and a metal organic CVD (MOCVD) method depending on a source gas.

By using the PECVD method, a high-quality film can be formed at a relatively low temperature. By using the TCVD method, in which plasma is not used, a film can be formed with few defects because damage caused by plasma does not occur.

When the CVD method is used, the composition of a film to be formed can be controlled with a flow rate ratio of the source gases. For example, by the MCVD method and the MOCVD method, a film with a certain composition can be formed depending on a flow rate ratio of the source gases. Moreover, with the MCVD method and the MOCVD method, by changing the flow rate ratio of the source gases while forming the film, a film whose composition is continuously changed can be formed. In the case where the film is formed while changing the flow rate ratio of the source gases, as compared to the case where the film is formed using a plurality of deposition chambers, time taken for the film formation can be reduced because time taken for transfer and pressure adjustment is not needed. Thus, transistors can be manufactured with improved productivity.

Next, part of the conductor to be the conductor 413 is etched, so that the conductor 413 is formed.

Next, the insulator 402 is formed (see FIG. 12A). The insulator 402 may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like. Note that here, the case where the top surface of the insulator 402 is planarized by a CMP method or the like is described. By planarizing the top surface of the insulator 402, the subsequent steps can be performed easily, and the yield of the transistor can be increased. For example, by a CMP method, the RMS roughness of the insulator 402 is less than or equal to 1 nm, preferably less than or equal to 0.5 nm, more preferably less than or equal to 0.3 nm. Ra with the measurement area of 1 μm×1 μm is less than 1 nm, preferably less than 0.6 nm, more preferably less than 0.5 nm, still more preferably less than 0.4 nm. P·V with the measurement area of 1 μm×1 μm is less than 10 nm, preferably less than 9 nm, more preferably less than 8 nm, still more preferably less than 7 nm. A transistor of one embodiment of the present invention is not limited to a transistor when the top surface of the insulator 402 is planarized.

The insulator 402 may be formed to contain excess oxygen. Alternatively, oxygen may be added after the insulator 402 is formed. The addition of oxygen may be performed by an ion implantation method at an acceleration voltage of higher than or equal to 2 kV and lower than or equal to 100 kV and at a dose of greater than or equal to 5×10¹⁴ ions/cm² and less than or equal to 5×10¹⁶ ions/cm², for example.

Note that in the case where the insulator 402 is a stacked-layer film, films in the stacked-layer film may be formed using by different formation methods such as the above formation methods. For example, the first film may be formed by a CVD method and the second film may be formed by an ALD method. Alternatively, the first film may be formed by a sputtering method and the second film may be formed by an ALD method. When films are formed by different formation methods as described above, the films can have different functions or different properties. Furthermore, by stacking the films, a more appropriate film can be formed as a stacked-layer film.

In other words, an n-th film (n is a natural number) is formed by at least one of a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, and the like, and an n+1-th film is formed by at least one of a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, and the like. Note that the n-th film and the n+1-th film may be formed by the same formation method or different formation methods. Note that the n-th film and the n+2-th film may be formed by the same formation method. Alternatively, all the films may be formed by the same formation method.

Next, a semiconductor to be the semiconductor 406 a and a semiconductor to be the semiconductor 406 b are formed in this order. The semiconductor to be the semiconductor 406 a and the semiconductor to be the semiconductor 406 b may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

In the case where In—Ga—Zn oxide layers are formed as the semiconductor to be the semiconductor 406 a and the semiconductor to be the semiconductor 406 b by an MOCVD method, trimethylindium, trimethylgallium, dimethylzinc, and the like may be used as the source gases. The source gas is not limited to the combination of these gases, triethylindium or the like may be used instead of trimethylindium. Triethylgallium or the like may be used instead of trimethylgallium. Diethylzinc or the like may be used instead of dimethylzinc.

Next, first heat treatment is preferably performed. The first heat treatment is performed at a temperature higher than or equal to 250° C. and lower than or equal to 650° C., preferably higher than or equal to 300° C. and lower than or equal to 500° C. The first heat treatment is performed in an inert gas atmosphere or an atmosphere containing an oxidizing gas at 10 ppm or more, 1% or more, or 10% or more. The first heat treatment may be performed under a reduced pressure. Alternatively, the first heat treatment may be performed in such a manner that heat treatment is performed in an inert gas atmosphere, and then another heat treatment is performed in an atmosphere containing an oxidizing gas at 10 ppm or more, 1% or more, or 10% or more in order to compensate desorbed oxygen. By the first heat treatment, crystallinity of the semiconductor to be the semiconductor 406 a and crystallinity of the semiconductor to be the semiconductor 406 b can be increased and impurities such as hydrogen and water can be removed.

Next, the semiconductor to be the semiconductor 406 a and the semiconductor to be the semiconductor 406 b are partly etched to form the semiconductor 406 a and the semiconductor 406 b (see FIG. 12B). In this case, the semiconductor 406 a and the semiconductor 406 b are formed to overlap with at least part of the conductor 413.

Next, a conductor to be the conductor 416 a and the conductor 416 b is formed. The conductor to be the conductor 416 a and the conductor 416 b may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

The conductor 416 a and the conductor 416 b are formed in such a manner that the conductor to be the conductor 416 a and the conductor 416 b is formed and then partly etched. Therefore, it is preferable to employ a formation method by which the semiconductor 406 b is not damaged when the conductor is formed. In other words, the conductor is preferably formed by an MCVD method or the like.

Note that in the case where the conductor is formed to have a stacked-layer structure, films in the stacked-layer film may be formed by different formation methods such as a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, and an ALD method. For example, the first film may be formed by an MOCVD method and the second film may be formed by a sputtering method. Alternatively, the first film may be formed by an ALD method and the second film may be formed by an MOCVD method. Alternatively, the first film may be formed by an ALD method and the second film may be formed by a sputtering method. Alternatively, the first film may be formed by an ALD method, the second film may be formed by a sputtering method, and the third film may be formed by an ALD method. When films are formed by different formation methods as described above, the films can have different functions or different properties. Furthermore, by stacking the films, a more appropriate film can be formed as a stacked-layer film.

In other words, in the case where the conductor is a stacked-layer film, for example, an n-th film (n is a natural number) is formed by at least one of a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, an ALD method, and the like and an n+1-th film is formed by at least one of a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, an ALD method, and the like. Note that the n-th film and the n+1-th film may be formed by different formation methods. Note that the n-th film and the n+2-th film may be formed by the same formation method. Alternatively, all the films may be formed by the same formation method.

Note that the conductor or at least one of the films in the stacked-layer film of the conductor and the semiconductor to be the semiconductor 406 a or the semiconductor to be the semiconductor 406 b may be formed by the same formation method. For example, both of them may be formed by an ALD method. Thus, they can be formed without exposure to the air. As a result, entry of impurities can be prevented.

Note that the conductor or at least one of the films in the stacked-layer film of the conductor, the semiconductor to be the semiconductor 406 a or the semiconductor to be the semiconductor 406 b, and the insulator 402 or at least one of the films in the stacked-layer film of the insulator 402 may be formed by the same formation method. For example, all of them may be formed by a sputtering method. Thus, they can be formed without exposure to the air. As a result, entry of impurities can be prevented. Note that a method for manufacturing a semiconductor device of one embodiment of the present invention is not limited thereto.

Next, part of the conductor to be the conductor 416 a and the conductor 416 b is etched, so that the conductor 416 a and the conductor 416 b are formed (see FIG. 13A). Next, a semiconductor to be the semiconductor 406 c is formed. The semiconductor to be the semiconductor 406 c can be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

In the case where an In—Ga—Zn oxide layer is formed as the semiconductor to be the semiconductor 406 c by an MOCVD method, trimethylindium, trimethylgallium, dimethylzinc, or the like may be used as the source gases. The source gas is not limited to the above combination of these gases, triethylindium or the like may be used instead of trimethylindium. Triethylgallium or the like may be used instead of trimethylgallium. Diethylzinc or the like may be used instead of dimethylzinc.

Next, second heat treatment may be performed. For example, as the semiconductor 406 a, a semiconductor whose oxygen-transmitting property is higher than that of the semiconductor to be the semiconductor 406 c is selected. That is, as the semiconductor to be the semiconductor 406 c, a semiconductor whose oxygen-transmitting property is lower than that of the semiconductor 406 a is selected. In other words, as the semiconductor 406 a, a semiconductor having a function of passing oxygen is selected. As the semiconductor to be the semiconductor 406 c, a semiconductor having a function of blocking oxygen is selected. In this case, by the second heat treatment, excess oxygen in the insulator 402 is moved to the semiconductor 406 b through the semiconductor 406 a. The semiconductor 406 b is covered with the semiconductor to be the semiconductor 406 c; thus, outward diffusion of excess oxygen is less likely to occur. Therefore, by performing the second heat treatment at this time, defects (oxygen vacancies) in the semiconductor 406 b can be efficiently reduced. Note that the second heat treatment may be performed at a temperature such that excess oxygen (oxygen) in the insulator 402 is diffused to the semiconductor 406 b. For example, the description of the first heat treatment may be referred to for the second heat treatment. The second heat treatment is preferably performed at a temperature lower than that of the first heat treatment by higher than or equal to 20° C. and lower than or equal to 150° C., preferably higher than or equal to 40° C. and lower than or equal to 100° C. because excess oxygen (oxygen) is not released from the insulator 402 too much.

Next, an insulator to be the insulator 412 is formed. The insulator to be the insulator 412 may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

Note that in the case where the insulator to be the insulator 412 is formed to have a stacked-layer structure, films in the stacked-layer film may be formed by different formation methods such as a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, and an ALD method. For example, the first film may be formed by an MOCVD method and the second film may be formed by a sputtering method. Alternatively, the first film may be formed by an ALD method and the second film may be formed by an MOCVD method. Alternatively, the first film may be formed by an ALD method and the second film may be formed by a sputtering method. Alternatively, the first film may be formed by an ALD method, the second film may be formed by a sputtering method, and the third film may be formed by an ALD method. Thus, when films are formed by different formation methods, the films can have different functions or different properties. Furthermore, by stacking the films, a more appropriate film can be formed as a stacked-layer film.

In other words, in the case where the insulator to be the insulator 412 is a stacked-layer film, for example, an n-th film (n is a natural number) is formed by at least one of a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, an ALD method, and the like and an n+1-th film is formed by at least one of a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, an ALD method, and the like. Note that the n-th film and the n+1-th film may be formed by different formation methods. Note that the n-th film and the n+2-th film may be formed by the same formation method. Alternatively, all the films may be formed by the same formation method.

Note that the insulator to be the insulator 412 or at least one of the films in the stacked-layer film of the insulator to be the insulator 412 and the conductor to be the conductor 416 a and the conductor 416 b or at least one of films in a stacked-layer film of the conductor may be formed by the same formation method. For example, both of them may be formed by an ALD method. Thus, they can be formed without exposure to the air. As a result, entry of impurities can be prevented. For example, the conductor to be the conductor 416 a and the conductor 416 b and the insulator to be the insulator 412 which are in contact with each other may be formed by the same formation method. Thus, the formation can be performed in the same chamber. As a result, entry of impurities can be prevented.

Note that the insulator to be the insulator 412 or at least one of the films in the stacked-layer film of the insulator to be the insulator 412, the conductor to be the conductor 416 a and the conductor 416 b or at least one of the films in the stacked-layer film of the conductor, the semiconductor to be the semiconductor 406 a or at least one of films in a stacked-layer film of the semiconductor to be the semiconductor 406 a, the semiconductor to be the semiconductor 406 b or at least one of films in a stacked-layer film of the semiconductor to be the semiconductor 406 b, and the insulator 402 or at least one of the films in the stacked-layer film of the insulator 402 may be formed by the same formation method. For example, all of them may be formed by a sputtering method. Thus, they can be formed without exposure to the air. As a result, entry of impurities can be prevented.

Next, third heat treatment may be performed. For example, as the semiconductor 406 a, a semiconductor whose oxygen-transmitting property is higher than that of the semiconductor to be the semiconductor 406 c is selected. That is, as the semiconductor to be the semiconductor 406 c, a semiconductor whose oxygen-transmitting property is lower than that of the semiconductor 406 a. As the semiconductor to be the semiconductor 406 c, a semiconductor having a function of blocking oxygen is selected. For example, as the semiconductor 406 a, a semiconductor whose oxygen-transmitting property is higher than that of the insulator to be the insulator 412 is selected. That is, as the insulator to be the insulator 412, a semiconductor whose oxygen-transmitting property is lower than that of the semiconductor 406 a is selected. In other words, as the semiconductor 406 a, a semiconductor having a function of passing oxygen is selected. As the insulator to be the insulator 412, an insulator having a function of blocking oxygen is selected. In this case, by the third heat treatment, excess oxygen in the insulator 402 is moved to the semiconductor 406 b through the semiconductor 406 a. The semiconductor 406 b is covered with the semiconductor to be the semiconductor 406 c and the insulator to be the insulator 412; thus, outward diffusion of excess oxygen is less likely to occur. Therefore, by performing the third heat treatment at this time, defects (oxygen vacancies) in the semiconductor 406 b can be efficiently reduced. Note that the third heat treatment may be performed at a temperature such that excess oxygen (oxygen) in the insulator 402 is diffused to the semiconductor 406 b. For example, the description of the first heat treatment may be referred to for the third heat treatment. The third heat treatment is preferably performed at a temperature lower than that of the first heat treatment by higher than or equal to 20° C. and lower than or equal to 150° C., preferably higher than or equal to 40° C. and lower than or equal to 100° C. because excess oxygen (oxygen) is not released from the insulator 402 too much. Note that in the case where the insulator to be the insulator 412 has a function of blocking oxygen, the semiconductor to be the semiconductor 406 c does not necessarily have a function of blocking oxygen.

Next, a conductor to be the conductor 404 is formed. The conductor to be the conductor 404 may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

The insulator to be the insulator 412 functions as a gate insulator of the transistor. Therefore, the conductor to be the conductor 404 is preferably formed by a formation method by which the insulator to be the insulator 412 is not damaged when the conductor to be the conductor 404 is formed. In other words, the conductor is preferably formed by an MCVD method or the like.

Note that in the case where the conductor to be the conductor 404 is formed to have a stacked-layer structure, films in the stacked-layer film may be formed by different formation methods such as a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, and an ALD method. For example, the first film may be formed by an MOCVD method and the second film may be formed by a sputtering method. Alternatively, the first film may be formed by an ALD method and the second film may be formed by an MOCVD method. Alternatively, the first film may be formed by an ALD method and the second film may be formed by a sputtering method. Alternatively, the first film may be formed by an ALD method, the second film may be formed by a sputtering method, and the third film may be formed by an ALD method. Thus, when films are formed by different formation methods, the films can have different functions or different properties. Furthermore, by stacking the films, a more appropriate film can be formed as a stacked-layer film.

In other words, in the case where the conductor to be the conductor 404 is a stacked-layer film, for example, an n-th film (n is a natural number) is formed by at least one of a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, an ALD method, and the like and an n+1-th film is formed by at least one of a sputtering method, a CVD method (a plasma CVD method, a thermal CVD method, an MCVD method, an MOCVD method, or the like), an MBE method, a PLD method, an ALD method, and the like. Note that the n-th film and the n+1-th film may be formed by different formation methods. Note that the n-th film and the n+2-th film may be formed by the same formation method. Alternatively, all the films may be formed by the same formation method.

Note that the conductor to be the conductor 404 or at least one of the films in the stacked-layer film of the conductor to be the conductor 404 and the insulator to be the insulator 412 or at least one of the films in the stacked-layer film of the insulator to be the insulator 412 may be formed by the same formation method. For example, both of them may be formed by an ALD method. Thus, they can be formed without exposure to the air. As a result, entry of impurities can be prevented. For example, the conductor to be the conductor 404 and the insulator to be the insulator 412 which are in contact with each other may be formed by the same formation method. Thus, the formation can be performed in the same chamber. As a result, entry of impurities can be prevented.

Note that the conductor to be the conductor 404 or at least one of the films in the stacked-layer film of the conductor to be the conductor 404, the insulator to be the insulator 412 or at least one of the films in the stacked-layer film of the insulator to be the insulator 412, the conductor to be the conductor 416 a and the conductor 416 b or at least one of the films in the stacked-layer film of the conductor, the semiconductor to be the semiconductor 406 a, the semiconductor to be the semiconductor 406 b, the semiconductor to be the semiconductor 406 c, and the insulator 402 or at least one of the films in the stacked-layer film of the insulator 402 may be formed by the same formation method. For example, all of them may be formed by a sputtering method. Thus, they can be formed without exposure to the air. As a result, entry of impurities can be prevented.

Next, the conductor to be the conductor 404 is partly etched, so that the conductor 404 is formed. The conductor 404 is formed to overlap with at least part of the semiconductor 406 b.

Next, in a manner similar to that of the conductor to be the conductor 404, the insulator to be the insulator 412 is partly etched, so that the insulator 412 is formed.

Next, in a manner similar to those of the conductor to be the conductor 404 and the insulator to be the insulator 412, the semiconductor to be the semiconductor 406 c is partly etched, so that the semiconductor 406 c is formed (see FIG. 13B).

The conductor to be the conductor 404, the insulator to be the insulator 412, and the semiconductor to be the semiconductor 406 c may be partly etched through the same photolithography process, for example. Alternatively, the insulator to be the insulator 412 and the semiconductor to be the semiconductor 406 c may be etched using the conductor 404 as a mask. Thus, the conductor 404, the insulator 412, and the semiconductor 406 c have similar shapes in the top view. The whole or part of the insulator 412, the semiconductor 406 c, and the conductor 404 may be formed through different photolithography processes. In that case, the insulator 412 and/or the semiconductor 406 c may project as compared with the conductor 404 as illustrated in FIG. 13C1 or the conductor 404 may project as compared with the insulator 412 and/or the semiconductor 406 c as illustrated in FIG. 13C2. With such a shape, shape defects are reduced and gate leakage current can be reduced in some cases.

Next, the insulator 408 is formed (see FIG. 14A). The insulator 408 may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

Next, fourth heat treatment may be performed. For example, as the semiconductor 406 a, a semiconductor whose oxygen-transmitting property is higher than that of the semiconductor 406 c is selected. In other words, as the semiconductor 406 c, a semiconductor whose oxygen-transmitting property is lower than that of the semiconductor 406 a is selected. As the semiconductor 406 c, a semiconductor having a function of blocking oxygen is selected. For example, as the semiconductor 406 a, a semiconductor whose oxygen-transmitting property is higher than that of the insulator 412 is selected. In other words, as the insulator 412, a semiconductor whose oxygen-transmitting property is lower than that of the semiconductor 406 a is selected. For example, as the semiconductor 406 a, a semiconductor whose oxygen-transmitting property is higher than that of the insulator 408 is selected. That is, as the insulator 408, a semiconductor whose oxygen-transmitting property is lower than that of the semiconductor 406 a is selected. In other words, as the semiconductor 406 a, a semiconductor having a function of passing oxygen is selected. As the insulator 408, an insulator having a function of blocking oxygen is selected. In this case, by the fourth heat treatment, excess oxygen in the insulator 402 is moved to the semiconductor 406 b through the semiconductor 406 a. The semiconductor 406 b is covered with any of the semiconductor 406 c, the insulator 412, and the insulator 408; thus, outward diffusion of excess oxygen is less likely to occur. Therefore, by performing the fourth heat treatment at this time, defects (oxygen vacancies) in the semiconductor 406 b can be efficiently reduced. Note that the fourth heat treatment may be performed at a temperature such that excess oxygen (oxygen) in the insulator 402 is diffused to the semiconductor 406 b. For example, the description of the first heat treatment may be referred to for the fourth heat treatment. The fourth heat treatment is preferably performed at a temperature lower than that of the first heat treatment by higher than or equal to 20° C. and lower than or equal to 150° C., preferably higher than or equal to 40° C. and lower than or equal to 100° C. because excess oxygen (oxygen) is not released from the insulator 402 too much. Note that in the case where the insulator 408 has a function of blocking oxygen, the semiconductor 406 c and/or the insulator 412 does not necessarily have a function of blocking oxygen.

One or more of the first heat treatment, the second heat treatment, the third heat treatment, and the fourth heat treatment are not necessarily performed.

Next, the insulator 418 is formed (see FIG. 14B). The insulator 418 may be formed by a sputtering method, a CVD method, an MBE method, a PLD method, an ALD method, or the like.

Through the above steps, the transistor illustrated in FIGS. 1A and 1B can be manufactured.

<Transistor Structure 2>

FIGS. 15A and 15B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention. FIG. 15A is a top view and FIG. 15B is a cross-sectional view taken along dashed-dotted line 11-12 and dashed-dotted line 13-14 in FIG. 15A. Note that for simplification of the drawing, some components are not illustrated in the top view in FIG. 15A.

The transistor in FIGS. 15A and 15B includes a conductor 513 over a substrate 500, an insulator 502 having a projection over the substrate 500 and the conductor 513, a semiconductor 506 a over the projection of the insulator 502, a semiconductor 506 b over the semiconductor 506 a, a semiconductor 506 c over the semiconductor 506 b, a conductor 516 a and a conductor 516 b which are in contact with the semiconductor 506 a, the semiconductor 506 b, and the semiconductor 506 c and which are arranged to be separated from each other, an insulator 512 over the semiconductor 506 c, the conductor 516 a, and the conductor 516 b, a conductor 504 over the insulator 512, an insulator 508 over the conductor 516 a, the conductor 516 b, the insulator 512, and the conductor 504, and an insulator 518 over the insulator 508.

The insulator 512 is in contact with at least side surfaces of the semiconductor 506 b in the cross section taken along line 13-14. The conductor 504 faces a top surface and the side surfaces of the semiconductor 506 b with at least the insulator 512 provided therebetween in the cross section taken along line 13-14. The conductor 513 faces a bottom surface of the semiconductor 506 b with the insulator 502 provided therebetween. The insulator 502 does not necessarily have a projection. The semiconductor 506 c, the insulator 508, or the insulator 518 is not necessarily provided.

The semiconductor 506 b serves as a channel formation region of the transistor. The conductor 504 serves as a first gate electrode (also referred to as a front gate electrode) of the transistor. The conductor 513 serves as a second gate electrode (also referred to as a back gate electrode) of the transistor. The conductor 516 a and the conductor 516 b serve as a source electrode and a drain electrode of the transistor. The insulator 508 functions as a barrier layer. The insulator 508 has, for example, a function of blocking oxygen and/or hydrogen. Alternatively, the insulator 508 has, for example, a higher capability of blocking oxygen and/or hydrogen than the semiconductor 506 a and/or the semiconductor 506 c.

The insulator 502 is an insulator containing excess oxygen.

For the substrate 500, the description of the substrate 400 is referred to. For the conductor 513, the description of the conductor 413 is referred to. For the insulator 502, the description of the insulator 402 is referred to. For the semiconductor 506 a, the description of the semiconductor 406 a is referred to. For the semiconductor 506 b, the description of the semiconductor 406 b is referred to. For the semiconductor 506 c, the description of the semiconductor 406 c is referred to. For the conductor 516 a and the conductor 516 b, the description of the conductor 416 a and the conductor 416 b is referred to. For the insulator 512, the description of the insulator 412 is referred to. For the conductor 504, the description of the conductor 404 is referred to. For the insulator 508, the description of the insulator 408 is referred to. For the insulator 518, the description of the insulator 418 is referred to.

Therefore, the transistor in FIGS. 15A and 15B is different from the transistor in FIGS. 1A and 1B in only part of the structure, and specifically, the structures of the semiconductor 506 a, the semiconductor 506 b, and the semiconductor 506 c of the transistor in FIGS. 15A and 15B are different from the structures of the semiconductor 406 a, the semiconductor 406 b, and the semiconductor 406 c of the transistor in FIGS. 1A and 1B. Thus, for the transistor in FIGS. 15A and 15B, the description of the transistor in FIGS. 1A and 1B can be referred to as appropriate.

Although FIGS. 15A and 15B show an example where the conductor 504 which is a first gate electrode of a transistor is not electrically connected to the conductor 513 which is a second gate electrode, a transistor structure of one embodiment of the present invention is not limited thereto. For example, as illustrated in FIG. 16A, the conductor 504 may be in contact with the conductor 513. With such a structure, the conductor 504 and the conductor 513 are supplied with the same potential; thus, switching characteristics of the transistor can be improved. Alternatively, as illustrated in FIG. 16B, the conductor 513 is not necessarily provided.

FIG. 17A is an example of a top view of a transistor. FIG. 17B is an example of a cross-sectional view taken along dashed-dotted line J1-J2 and dashed-dotted line J3-J4 in FIG. 17A. Note that some components such as an insulator are omitted in FIG. 17A for easy understanding.

Although an example where the insulator 512 and the conductor 504 have similar shapes in the top view in FIG. 15A is shown, a transistor structure of one embodiment of the present invention is not limited thereto. For example, as illustrated in FIGS. 17A and 17B, the insulator 512 may be provided over the insulator 502, the semiconductor 506 c, the conductor 516 a, and the conductor 516 b.

<Transistor Structure 3>

FIGS. 18A and 18B are a top view and a cross-sectional view which illustrate a transistor of one embodiment of the present invention. FIG. 18A is a top view and FIG. 18B is a cross-sectional view taken along dashed-dotted line K1-K2 and dashed-dotted line K3-K4 in FIG. 18A. Note that for simplification of the drawing, some components are not illustrated in the top view in FIG. 18A.

The transistor in FIGS. 18A and 18B includes a conductor 604 over a substrate 600, an insulator 612 over the conductor 604, a semiconductor 606 a over the insulator 612, a semiconductor 606 b over the semiconductor 606 a, a semiconductor 606 c over the semiconductor 606 b, a conductor 616 a and a conductor 616 b which are in contact with the semiconductor 606 a, the semiconductor 606 b, and the semiconductor 606 c and which are arranged to be separated from each other, and an insulator 618 over the semiconductor 606 c, the conductor 616 a, and the conductor 616 b. The conductor 604 faces a bottom surface of the semiconductor 606 b with the insulator 612 provided therebetween. The insulator 612 may have a projection. An insulator may be provided between the substrate 600 and the conductor 604. For the insulator, the description of the insulator 502 or the insulator 508 is referred to. The semiconductor 606 a or the insulator 618 is not necessarily provided.

The semiconductor 606 b serves as a channel formation region of the transistor. The conductor 604 serves as a first gate electrode (also referred to as a front gate electrode) of the transistor. The conductor 616 a and the conductor 616 b serve as a source electrode and a drain electrode of the transistor.

The insulator 618 is an insulator containing excess oxygen.

For the substrate 600, the description of the substrate 500 is referred to. For the conductor 604, the description of the conductor 504 is referred to. For the insulator 612, the description of the insulator 512 is referred to. For the semiconductor 606 a, the description of the semiconductor 506 c is referred to. For the semiconductor 606 b, the description of the semiconductor 506 b is referred to. For the semiconductor 606 c, the description of the semiconductor 506 a is referred to. For the conductor 616 a and the conductor 616 b, the description of the conductor 516 a and the conductor 516 b is referred to. For the insulator 618, the description of the insulator 502 is referred to.

Thus, the transistor in FIGS. 18A and 18B can be regarded to be different from the transistor in FIGS. 15A and 15B in only part of the structure in some cases. Specifically, the structure of the transistor in FIGS. 18A and 18B is similar to the structure of the transistor in FIGS. 15A and 15B in which the conductor 504 is not provided. Thus, for the transistor in FIGS. 18A and 18B, the description of the transistor in FIGS. 15A and 15B can be referred to as appropriate.

The transistor may include a conductor which overlaps with the semiconductor 606 b with the insulator 618 provided therebetween. The conductor functions as a second gate electrode of the transistor. For the conductor, the description of the conductor 513 is referred to. Furthermore, an s-channel structure may be formed using the second gate electrode.

Over the insulator 618, a display element may be provided. For example, a pixel electrode, a liquid crystal layer, a common electrode, a light-emitting layer, an organic EL layer, an anode electrode, a cathode electrode, or the like may be provided. The display element is connected to the conductor 616 a or the like, for example.

FIG. 19A is an example of a top view of a transistor. FIG. 19B is an example of a cross-sectional view taken along dashed-dotted line L1-L2 and dashed-dotted line L3-L4 in FIG. 19A. Note that some components such as an insulator are omitted in FIG. 19A for easy understanding.

Over the semiconductor, an insulator that can function as a channel protective film may be provided. For example, as illustrated in FIGS. 19A and 19B, an insulator 620 may be provided between the semiconductor 606 c and the conductors 616 a and 616 b. In that case, the conductor 616 a (conductor 616 b) and the semiconductor 606 c are connected to each other through an opening in the insulator 620. For the insulator 620, the description of the insulator 618 may be referred to.

In FIG. 18B and FIG. 19B, a conductor 613 may be provided over the insulator 618. Examples in that case are shown in FIGS. 20A and 20B. For the conductor 613, the description of the conductor 513 is referred to. A potential or signal which is the same as that supplied to the conductor 604 or a potential or signal which is different from that supplied to the conductor 604 may be supplied to the conductor 613. For example, by supplying a constant potential to the conductor 613, the threshold voltage of a transistor may be controlled. In other words, the conductor 613 can function as a second gate electrode.

<Semiconductor Device>

An example of a semiconductor device of one embodiment of the present invention is shown below.

An example of a semiconductor device including a transistor of one embodiment of the present invention is shown below.

FIG. 21A is a cross-sectional view of a semiconductor device of one embodiment of the present invention. The semiconductor device illustrated in FIG. 21A includes a transistor 2200 using a first semiconductor in a lower portion and a transistor 2100 using a second semiconductor in an upper portion. FIG. 21A shows an example in which the transistor illustrated in FIGS. 1A and 1B is used as the transistor 2100 using the second semiconductor.

As the first semiconductor, a semiconductor having an energy gap different from that of the second semiconductor may be used. For example, the first semiconductor is a semiconductor other than an oxide semiconductor and the second semiconductor is an oxide semiconductor. As the first semiconductor, silicon, germanium, or the like which has a polycrystalline structure, a single crystal structure, or the like may be used. Alternatively, a semiconductor having distortion such as distorted silicon may be used. Alternatively, as the first semiconductor, gallium arsenide, aluminum gallium arsenide, indium gallium arsenide, gallium nitride, indium phosphide, silicon germanium, or the like which can be used for a HEMT may be used. By using any of these semiconductors as the first semiconductor, the transistor 2200 capable of high speed operation can be obtained. By using an oxide semiconductor as the second semiconductor, the transistor 2100 with a low off-state current can be obtained.

Note that the transistor 2200 may be either an n-channel transistor or a p-channel transistor, and an appropriate transistor is used in accordance with a circuit. As the transistor 2100 and/or the transistor 2200, the above-described transistor or the transistor illustrated in FIG. 21A is not necessarily used in some cases.

The semiconductor device illustrated in FIG. 21A includes the transistor 2100 above the transistor 2200 with an insulator 2201 and an insulator 2207 provided therebetween. Between the transistor 2200 and the transistor 2100, a plurality of conductors 2202 which function as wirings are provided. Wirings or electrodes provided in an upper layer and a lower layer are electrically connected to each other by a plurality of conductors 2203 embedded in insulating films. Furthermore, the semiconductor device includes an insulator 2204 over the transistor 2100, a conductor 2205 over the insulator 2204, and a conductor 2206 formed in the same layer (through the same steps) as a source electrode and a drain electrode of the transistor 2100.

The insulator 2204 may be formed to have, for example, a single-layer structure or a stacked-layer structure including an insulator containing boron, carbon, nitrogen, oxygen, fluorine, magnesium, aluminum, silicon, phosphorus, chlorine, argon, gallium, germanium, yttrium, zirconium, lanthanum, neodymium, hafnium, or tantalum. Note that the insulator 2204 may include an insulator containing nitrogen such as silicon nitride oxide or silicon nitride.

A resin may be used as the insulator 2204. For example, a resin containing polyimide, polyamide, acrylic, silicone, or the like may be used. The use of a resin does not need planarization treatment performed on the top surface of the insulator 2204 in some cases. By using a resin, a thick film can be formed in a short time; thus, the productivity can be increased.

By stacking a plurality of transistors, a plurality of circuits can be arranged with high density.

Here, in the case where single crystal silicon is used as the first semiconductor of the transistor 2200, the hydrogen concentration in an insulator near the first semiconductor of the transistor 2200 is preferably high. The hydrogen terminates dangling bonds of silicon, so that the reliability of the transistor 2200 can be increased. On the other hand, in the case where an oxide semiconductor is used as the second semiconductor of the transistor 2100, the hydrogen concentration in an insulator near the second semiconductor of the transistor 2100 is preferably low. The hydrogen causes generation of carriers in the oxide semiconductor, which might lead to a decrease in the reliability of the transistor 2100. Therefore, in the case where the transistor 2200 using single crystal silicon and the transistor 2100 using an oxide semiconductor are stacked, providing the insulator 2207 having a function of blocking hydrogen between the transistors is effective because the reliability of the transistors can be increased.

The insulator 2207 may be, for example, formed to have a single-layer structure or a stacked-layer structure using an insulator containing aluminum oxide, aluminum oxynitride, gallium oxide, gallium oxynitride, yttrium oxide, yttrium oxynitride, hafnium oxide, hafnium oxynitride, yttria-stabilized zirconia (YSZ), or the like.

Furthermore, an insulator having a function of blocking hydrogen is preferably formed over the transistor 2100 to cover the transistor 2100 using an oxide semiconductor. As the insulator, an insulator that is similar to the insulator 2207 can be used, and in particular, an aluminum oxide film is preferably used. The aluminum oxide film has a high blocking effect of preventing penetration of both oxygen and impurities such as hydrogen and moisture. Thus, by using the aluminum oxide film as an insulator 2208 covering the transistor 2100, release of oxygen from the oxide semiconductor included in the transistor 2100 can be prevented and entry of water and hydrogen into the oxide semiconductor can be prevented.

Note that the transistor 2200 can be a transistor of various types without being limited to a planar type transistor. For example, a FIN-type transistor can be used. An example of a cross-sectional view in this case is shown in FIG. 21B. An insulating layer 2212 is provided over a semiconductor substrate 2211. The semiconductor substrate 2211 includes a projection with a thin tip (also referred to a fin). Alternatively, the projection may not have the thin tip; a projection with a cuboid-like projection and a projection with a thick tip are permitted, for example. A gate insulator 2214 is provided over the projection of the semiconductor substrate 2211, and a gate electrode 2213 is provided over the gate insulator 2214. Source and drain regions 2215 are formed in the semiconductor substrate 2211. Note that here is shown an example in which the semiconductor substrate 2211 includes the projection; however, a semiconductor device of one embodiment of the present invention is not limited thereto. For example, a semiconductor region having a projection may be formed by processing an SOI substrate.

In the above circuit, electrodes of the transistor 2100 and the transistor 2200 can be connected in a variety of ways; thus, a variety of circuits can be formed. Examples of circuit configurations which can be achieved by using a semiconductor device of one embodiment of the present invention are shown below.

A circuit diagram in FIG. 22A shows a configuration of a so-called CMOS inverter in which the p-channel transistor 2200 and the n-channel transistor 2100 are connected to each other in series and in which gates of them are connected to each other.

A circuit diagram in FIG. 22B shows a configuration in which sources of the transistors 2100 and 2200 are connected to each other and drains of the transistors 2100 and 2200 are connected to each other. With such a configuration, the transistors can function as a so-called CMOS analog switch.

An example of a semiconductor device (memory device) which includes the transistor of one embodiment of the present invention, which can retain stored data even when not powered, and which has an unlimited number of write cycles is shown in FIGS. 23A and 23B.

The semiconductor device illustrated in FIG. 23A includes a transistor 3200 using a first semiconductor, a transistor 3300 using a second semiconductor, and a capacitor 3400. Note that any of the above-described transistors can be used as the transistor 3300.

The transistor 3300 is a transistor using an oxide semiconductor. Since the off-state current of the transistor 3300 is low, stored data can be retained for a long period at a predetermined node of the semiconductor device. In other words, power consumption of the semiconductor device can be reduced because refresh operation becomes unnecessary or the frequency of refresh operation can be extremely low.

In FIG. 23A, a first wiring 3001 is electrically connected to a source of the transistor 3200. A second wiring 3002 is electrically connected to a drain of the transistor 3200. A third wiring 3003 is electrically connected to one of the source and the drain of the transistor 3300. A fourth wiring 3004 is electrically connected to the gate of the transistor 3300. The gate of the transistor 3200 and the other of the source and the drain of the transistor 3300 are electrically connected to the one electrode of the capacitor 3400. A fifth wiring 3005 is electrically connected to the other electrode of the capacitor 3400.

The semiconductor device in FIG. 23A has a feature that the potential of the gate of the transistor 3200 can be retained, and thus enables writing, retaining, and reading of data as follows.

Writing and retaining of data are described. First, the potential of the fourth wiring 3004 is set to a potential at which the transistor 3300 is turned on, so that the transistor 3300 is turned on. Accordingly, the potential of the third wiring 3003 is supplied to a node FG where the gate of the transistor 3200 and the one electrode of the capacitor 3400 are electrically connected to each other. That is, a predetermined charge is supplied to the gate of the transistor 3200 (writing). Here, one of two kinds of charges providing different potential levels (hereinafter referred to as a low-level charge and a high-level charge) is supplied. After that, the potential of the fourth wiring 3004 is set to a potential at which the transistor 3300 is turned off, so that the transistor 3300 is turned off. Thus, the charge is held at the node FG (retaining).

Since the off-state current of the transistor 3300 is extremely low, the charge of the node FG is retained for a long time.

Next, reading of data is described. An appropriate potential (a reading potential) is supplied to the fifth wiring 3005 while a predetermined potential (a constant potential) is supplied to the first wiring 3001, whereby the potential of the second wiring 3002 varies depending on the amount of charge retained in the node FG. This is because in the case of using an n-channel transistor as the transistor 3200, an apparent threshold voltage V_(th) _(_) _(H) at the time when the high-level charge is given to the gate of the transistor 3200 is lower than an apparent threshold voltage V_(th) _(_) _(L) at the time when the low-level charge is given to the gate of the transistor 3200. Here, an apparent threshold voltage refers to the potential of the fifth wiring 3005 which is needed to turn on the transistor 3200. Thus, the potential of the fifth wiring 3005 is set to a potential V₀ which is between V_(th) _(_) _(H) and V_(th) _(_) _(L), whereby charge supplied to the node FG can be determined. For example, in the case where the high-level charge is supplied to the node FG in writing and the potential of the fifth wiring 3005 is V₀ (>V_(th) _(_) _(H)), the transistor 3200 is turned on. On the other hand, in the case where the low-level charge is supplied to the node FG in writing, even when the potential of the fifth wiring 3005 is V₀ (<V_(th) _(_) _(L)), the transistor 3200 remains off. Thus, the data retained in the node FG can be read by determining the potential of the second wiring 3002.

Note that in the case where memory cells are arrayed, it is necessary that data of a desired memory cell is read in read operation. In the case where data of the other memory cells is not read, the fifth wiring 3005 may be supplied with a potential at which the transistor 3200 is turned off regardless of the charge supplied to the node FG, that is, a potential lower than V_(th) _(_) _(H). Alternatively, the fifth wiring 3005 may be supplied with a potential at which the transistor 3200 is turned on regardless of the charge supplied to the node FG, that is, a potential higher than V_(th) _(_) _(L).

The semiconductor device in FIG. 23B is different form the semiconductor device in FIG. 23A in that the transistor 3200 is not provided. Also in this case, writing and retaining operation of data can be performed in a manner similar to that of the semiconductor device in FIG. 23A.

Reading of data in the semiconductor device in FIG. 23B is described. When the transistor 3300 is turned on, the third wiring 3003 which is in a floating state and the capacitor 3400 are electrically connected to each other, and the charge is redistributed between the third wiring 3003 and the capacitor 3400. As a result, the potential of the third wiring 3003 is changed. The amount of change in potential of the third wiring 3003 varies depending on the potential of the one electrode of the capacitor 3400 (or the charge accumulated in the capacitor 3400).

For example, the potential of the third wiring 3003 after the charge redistribution is (C_(B)×V_(B0)+C×V)/(C_(B)+C), where V is the potential of the one electrode of the capacitor 3400, C is the capacitance of the capacitor 3400, C_(B) is the capacitance component of the third wiring 3003, and V_(B0) is the potential of the third wiring 3003 before the charge redistribution. Thus, it can be found that, assuming that the memory cell is in either of two states in which the potential of the one electrode of the capacitor 3400 is V₁ and V₀ (V₁>V₀), the potential of the third wiring 3003 in the case of retaining the potential V₁ (=(C_(B)×V_(B0)+C×V₁)/(C_(B)+C)) is higher than the potential of the third wiring 3003 in the case of retaining the potential V₀ (=(C_(B)×V_(B0)+C×V₀)/(C_(B)+C)).

Then, by comparing the potential of the third wiring 3003 with a predetermined potential, data can be read.

In this case, a transistor including the first semiconductor may be used for a driver circuit for driving a memory cell, and a transistor including the second semiconductor may be stacked over the driver circuit as the transistor 3300.

When including a transistor using an oxide semiconductor and having an extremely low off-state current, the semiconductor device described above can retain stored data for a long time. In other words, refresh operation becomes unnecessary or the frequency of the refresh operation can be extremely low, which leads to a sufficient reduction in power consumption. Moreover, stored data can be retained for a long time even when power is not supplied (note that a potential is preferably fixed).

In the semiconductor device, high voltage is not needed for writing data and deterioration of elements is less likely to occur. Unlike in a conventional nonvolatile memory, for example, it is not necessary to inject and extract electrons into and from a floating gate; thus, a problem such as deterioration of an insulator is not caused. That is, the semiconductor device of one embodiment of the present invention does not have a limit on the number of times data can be rewritten, which is a problem of a conventional nonvolatile memory, and the reliability thereof is drastically improved. Furthermore, data is written depending on the state of the transistor (on or off), whereby high-speed operation can be easily achieved.

<RF Tag>

An RF tag including the transistor or the memory device is described below with reference to FIG. 24.

The RF tag of one embodiment of the present invention includes a memory circuit, stores data in the memory circuit, and transmits and receives data to/from the outside by using contactless means, for example, wireless communication. With these features, the RF tag can be used for an individual authentication system in which an object or the like is recognized by reading the individual information, for example. Note that the RF tag is required to have high reliability in order to be used for this purpose.

A configuration of the RF tag will be described with reference to FIG. 24. FIG. 24 is a block diagram illustrating a configuration example of an RF tag.

As shown in FIG. 24, an RF tag 800 includes an antenna 804 which receives a radio signal 803 that is transmitted from an antenna 802 connected to a communication device 801 (also referred to as an interrogator, a reader/writer, or the like). The RF tag 800 includes a rectifier circuit 805, a constant voltage circuit 806, a demodulation circuit 807, a modulation circuit 808, a logic circuit 809, a memory circuit 810, and a ROM 811. A semiconductor of a transistor having a rectifying function included in the demodulation circuit 807 may be a material which enables a reverse current to be low enough, for example, an oxide semiconductor. This can suppress the phenomenon of a rectifying function becoming weaker due to generation of a reverse current and prevent saturation of the output from the demodulation circuit. In other words, the input to the demodulation circuit and the output from the demodulation circuit can have a relation closer to a linear relation. Note that data transmission methods are roughly classified into the following three methods: an electromagnetic coupling method in which a pair of coils is provided so as to face each other and communicates with each other by mutual induction, an electromagnetic induction method in which communication is performed using an induction field, and a radio wave method in which communication is performed using a radio wave. Any of these methods can be used in the RF tag 800.

Next, the structure of each circuit will be described. The antenna 804 exchanges the radio signal 803 with the antenna 802 which is connected to the communication device 801. The rectifier circuit 805 generates an input potential by rectification, for example, half-wave voltage doubler rectification of an input alternating signal generated by reception of a radio signal at the antenna 804 and smoothing of the rectified signal with a capacitor provided in a later stage in the rectifier circuit 805. Note that a limiter circuit may be provided on an input side or an output side of the rectifier circuit 805. The limiter circuit controls electric power so that electric power which is higher than or equal to certain electric power is not input to a circuit in a later stage if the amplitude of the input alternating signal is high and an internal generation voltage is high.

The constant voltage circuit 806 generates a stable power supply voltage from an input potential and supplies it to each circuit. Note that the constant voltage circuit 806 may include a reset signal generation circuit. The reset signal generation circuit is a circuit which generates a reset signal of the logic circuit 809 by utilizing rise of the stable power supply voltage.

The demodulation circuit 807 demodulates the input alternating signal by envelope detection and generates the demodulated signal. Furthermore, the modulation circuit 808 performs modulation in accordance with data to be output from the antenna 804.

The logic circuit 809 analyzes and processes the demodulated signal. The memory circuit 810 holds the input data and includes a row decoder, a column decoder, a memory region, and the like. Furthermore, the ROM 811 stores an identification number (ID) or the like and outputs it in accordance with processing.

Note that the decision whether each circuit described above is provided or not can be made as appropriate as needed.

Here, the above-described memory device can be used as the memory circuit 810. Since the memory device of one embodiment of the present invention can retain data even when not powered, the memory device is suitable for an RF tag. Furthermore, the memory device of one embodiment of the present invention needs power (voltage) needed for data writing lower than that needed in a conventional nonvolatile memory; thus, it is possible to prevent a difference between the maximum communication range in data reading and that in data writing. In addition, it is possible to suppress malfunction or incorrect writing which is caused by power shortage in data writing.

Since the memory device of one embodiment of the present invention can be used as a nonvolatile memory, it can also be used as the ROM 811. In this case, it is preferable that a manufacturer separately prepare a command for writing data to the ROM 811 so that a user cannot rewrite data freely. Since the manufacturer gives identification numbers before shipment and then starts shipment of products, instead of putting identification numbers to all the manufactured RF tags, it is possible to put identification numbers to only good products to be shipped. Thus, the identification numbers of the shipped products are in series and customer management corresponding to the shipped products is easily performed.

Application Examples of RF Tag

Application examples of the RF tag of one embodiment of the present invention are shown below with reference to FIGS. 25A to 25F. The RF tag is widely used and can be provided for, for example, products such as bills, coins, securities, bearer bonds, documents (e.g., driver's licenses or resident's cards, see FIG. 25A), packaging containers (e.g., wrapping paper or bottles, see FIG. 25C), recording media (e.g., DVDs or video tapes, see FIG. 25B), vehicles (e.g., bicycles, see FIG. 25D), personal belongings (e.g., bags or glasses), foods, plants, animals, human bodies, clothing, household goods, medical supplies such as medicine and chemicals, and electronic devices (e.g., liquid crystal display devices, EL display devices, television sets, or cellular phones), or tags on products (see FIGS. 25E and 25F).

An RF tag 4000 of one embodiment of the present invention is fixed on products by, for example, being attached to a surface thereof or being embedded therein. For example, the RF tag 4000 is fixed to each product by being embedded in paper of a book, or embedded in an organic resin of a package. The RF tag 4000 of one embodiment of the present invention is small, thin, and lightweight, so that the design of a product is not impaired even after the RF tag 4000 of one embodiment of the present invention is fixed thereto. Furthermore, bills, coins, securities, bearer bonds, documents, or the like can have identification functions by being provided with the RF tag 4000 of one embodiment of the present invention, and the identification functions can be utilized to prevent counterfeits. Moreover, the efficiency of a system such as an inspection system can be improved by providing the RF tag 4000 of one embodiment of the present invention for packaging containers, recording media, personal belongings, foods, clothing, household goods, electronic devices, or the like. Vehicles can also have higher security against theft or the like by being provided with the RF tag 4000 of one embodiment of the present invention.

As described above, the RF tag of one embodiment of the present invention can be used for the above-described purposes.

<CPU>

A CPU including a semiconductor device such as any of the above-described transistors or the above-described memory device is described below.

FIG. 26 is a block diagram illustrating a configuration example of a CPU including any of the above-described transistors as a component.

The CPU illustrated in FIG. 26 includes, over a substrate 1190, an arithmetic logic unit (ALU) 1191, an ALU controller 1192, an instruction decoder 1193, an interrupt controller 1194, a timing controller 1195, a register 1196, a register controller 1197, a bus interface (Bus I/F) 1198, a rewritable ROM 1199, and a ROM interface (ROM I/F) 1189. A semiconductor substrate, an SOI substrate, a glass substrate, or the like is used as the substrate 1190. The ROM 1199 and the ROM interface 1189 may be provided over a separate chip. Needless to say, the CPU in FIG. 26 is just an example in which the configuration has been simplified, and an actual CPU may have a variety of configurations depending on the application. For example, the CPU may have the following configuration: a structure including the CPU illustrated in FIG. 26 or an arithmetic circuit is considered as one core; a plurality of the cores are included; and the cores operate in parallel. The number of bits that the CPU can process in an internal arithmetic circuit or in a data bus can be 8, 16, 32, or 64, for example.

An instruction that is input to the CPU through the bus interface 1198 is input to the instruction decoder 1193 and decoded therein, and then, input to the ALU controller 1192, the interrupt controller 1194, the register controller 1197, and the timing controller 1195.

The ALU controller 1192, the interrupt controller 1194, the register controller 1197, and the timing controller 1195 conduct various controls in accordance with the decoded instruction. Specifically, the ALU controller 1192 generates signals for controlling the operation of the ALU 1191. While the CPU is executing a program, the interrupt controller 1194 judges an interrupt request from an external input/output device or a peripheral circuit on the basis of its priority or a mask state, and processes the request. The register controller 1197 generates an address of the register 1196, and reads/writes data from/to the register 1196 in accordance with the state of the CPU.

The timing controller 1195 generates signals for controlling operation timings of the ALU 1191, the ALU controller 1192, the instruction decoder 1193, the interrupt controller 1194, and the register controller 1197. For example, the timing controller 1195 includes an internal clock generator for generating an internal clock signal CLK2 based on a reference clock signal CLK1, and supplies the internal clock signal CLK2 to the above circuits.

In the CPU illustrated in FIG. 26, a memory cell is provided in the register 1196. For the memory cell of the register 1196, any of the above-described transistors, the above-described memory device, or the like can be used.

In the CPU illustrated in FIG. 26, the register controller 1197 selects operation of retaining data in the register 1196 in accordance with an instruction from the ALU 1191. That is, the register controller 1197 selects whether data is retained by a flip-flop or by a capacitor in the memory cell included in the register 1196. When data retaining by the flip-flop is selected, a power supply voltage is supplied to the memory cell in the register 1196. When data retaining by the capacitor is selected, the data is rewritten in the capacitor, and supply of power supply voltage to the memory cell in the register 1196 can be stopped.

FIG. 27 is an example of a circuit diagram of a memory element 1200 that can be used as the register 1196. The memory element 1200 includes a circuit 1201 in which stored data is volatile when power supply is stopped, a circuit 1202 in which stored data is nonvolatile even when power supply is stopped, a switch 1203, a switch 1204, a logic element 1206, a capacitor 1207, and a circuit 1220 having a selecting function. The circuit 1202 includes a capacitor 1208, a transistor 1209, and a transistor 1210. Note that the memory element 1200 may further include another element such as a diode, a resistor, or an inductor, as needed.

Here, the above-described memory device can be used as the circuit 1202. When supply of a power supply voltage to the memory element 1200 is stopped, GND (0 V) or a potential at which the transistor 1209 in the circuit 1202 is turned off continues to be input to a gate of the transistor 1209. For example, the gate of the transistor 1209 is grounded through a load such as a resistor.

Shown here is an example in which the switch 1203 is a transistor 1213 having one conductivity type (e.g., an n-channel transistor) and the switch 1204 is a transistor 1214 having a conductivity type opposite to the one conductivity type (e.g., a p-channel transistor). A first terminal of the switch 1203 corresponds to one of a source and a drain of the transistor 1213, a second terminal of the switch 1203 corresponds to the other of the source and the drain of the transistor 1213, and conduction or non-conduction between the first terminal and the second terminal of the switch 1203 (i.e., the on/off state of the transistor 1213) is selected by a control signal RD input to a gate of the transistor 1213. A first terminal of the switch 1204 corresponds to one of a source and a drain of the transistor 1214, a second terminal of the switch 1204 corresponds to the other of the source and the drain of the transistor 1214, and conduction or non-conduction between the first terminal and the second terminal of the switch 1204 (i.e., the on/off state of the transistor 1214) is selected by the control signal RD input to a gate of the transistor 1214.

One of a source and a drain of the transistor 1209 is electrically connected to one of a pair of electrodes of the capacitor 1208 and a gate of the transistor 1210. Here, the connection portion is referred to as a node M2. One of a source and a drain of the transistor 1210 is electrically connected to a line which can supply a low power supply potential (e.g., a GND line), and the other thereof is electrically connected to the first terminal of the switch 1203 (the one of the source and the drain of the transistor 1213). The second terminal of the switch 1203 (the other of the source and the drain of the transistor 1213) is electrically connected to the first terminal of the switch 1204 (the one of the source and the drain of the transistor 1214). The second terminal of the switch 1204 (the other of the source and the drain of the transistor 1214) is electrically connected to a line which can supply a power supply potential VDD. The second terminal of the switch 1203 (the other of the source and the drain of the transistor 1213), the first terminal of the switch 1204 (the one of the source and the drain of the transistor 1214), an input terminal of the logic element 1206, and one of a pair of electrodes of the capacitor 1207 are electrically connected to each other. Here, the connection portion is referred to as a node M1. The other of the pair of electrodes of the capacitor 1207 can be supplied with a constant potential. For example, the other of the pair of electrodes of the capacitor 1207 can be supplied with a low power supply potential (e.g., GND) or a high power supply potential (e.g., VDD). The other of the pair of electrodes of the capacitor 1207 is electrically connected to the line which can supply a low power supply potential (e.g., a GND line). The other of the pair of electrodes of the capacitor 1208 can be supplied with a constant potential. For example, the other of the pair of electrodes of the capacitor 1208 can be supplied with the low power supply potential (e.g., GND) or the high power supply potential (e.g., VDD). The other of the pair of electrodes of the capacitor 1208 is electrically connected to the line which can supply a low power supply potential (e.g., a GND line).

The capacitor 1207 and the capacitor 1208 are not necessarily provided as long as the parasitic capacitance of the transistor, the wiring, or the like is actively utilized.

A control signal WE is input to the gate of the transistor 1209. As for each of the switch 1203 and the switch 1204, a conduction state or a non-conduction state between the first terminal and the second terminal is selected by the control signal RD which is different from the control signal WE. When the first terminal and the second terminal of one of the switches are in the conduction state, the first terminal and the second terminal of the other of the switches are in the non-conduction state.

A signal corresponding to data retained in the circuit 1201 is input to the other of the source and the drain of the transistor 1209. FIG. 27 illustrates an example in which a signal output from the circuit 1201 is input to the other of the source and the drain of the transistor 1209. The logic value of a signal output from the second terminal of the switch 1203 (the other of the source and the drain of the transistor 1213) is inverted by the logic element 1206, and the inverted signal is input to the circuit 1201 through the circuit 1220.

In the example of FIG. 27, a signal output from the second terminal of the switch 1203 (the other of the source and the drain of the transistor 1213) is input to the circuit 1201 through the logic element 1206 and the circuit 1220; however, one embodiment of the present invention is not limited thereto. The signal output from the second terminal of the switch 1203 (the other of the source and the drain of the transistor 1213) may be input to the circuit 1201 without its logic value being inverted. For example, in the case where the circuit 1201 includes a node in which a signal obtained by inversion of the logic value of a signal input from the input terminal is retained, the signal output from the second terminal of the switch 1203 (the other of the source and the drain of the transistor 1213) can be input to the node.

In FIG. 27, the transistors included in the memory element 1200 except for the transistor 1209 can each be a transistor in which a channel is formed in a film formed using a semiconductor other than an oxide semiconductor or in the substrate 1190. For example, the transistor can be a transistor whose channel is formed in a silicon layer or a silicon substrate. Alternatively, all the transistors in the memory element 1200 may be a transistor in which a channel is formed in an oxide semiconductor. Further alternatively, in the memory element 1200, a transistor in which a channel is formed in an oxide semiconductor can be included besides the transistor 1209, and a transistor in which a channel is formed in a layer or the substrate 1190 including a semiconductor other than an oxide semiconductor can be used for the rest of the transistors.

As the circuit 1201 in FIG. 27, for example, a flip-flop circuit can be used. As the logic element 1206, for example, an inverter or a clocked inverter can be used.

In a period during which the memory element 1200 is not supplied with the power supply voltage, the semiconductor device of one embodiment of the present invention can retain data stored in the circuit 1201 by the capacitor 1208 which is provided in the circuit 1202.

The off-state current of a transistor in which a channel is formed in an oxide semiconductor is extremely low. For example, the off-state current of a transistor in which a channel is formed in an oxide semiconductor is significantly lower than that of a transistor in which a channel is formed in silicon having crystallinity. Thus, when the transistor is used as the transistor 1209, a signal held in the capacitor 1208 is retained for a long time also in a period during which the power supply voltage is not supplied to the memory element 1200. The memory element 1200 can accordingly retain the stored content (data) also in a period during which the supply of the power supply voltage is stopped.

Since the above-described memory element performs pre-charge operation with the switch 1203 and the switch 1204, the time required for the circuit 1201 to retain original data again after the supply of the power supply voltage is restarted can be shortened.

In the circuit 1202, a signal retained by the capacitor 1208 is input to the gate of the transistor 1210. Therefore, after supply of the power supply voltage to the memory element 1200 is restarted, the signal retained by the capacitor 1208 can be converted into the one corresponding to the state (the on state or the off state) of the transistor 1210 to be read from the circuit 1202. Consequently, an original signal can be accurately read even when a potential corresponding to the signal retained by the capacitor 1208 varies to some degree.

By applying the above-described memory element 1200 to a memory device such as a register or a cache memory included in a processor, data in the memory device can be prevented from being lost owing to the stop of the supply of the power supply voltage. Furthermore, shortly after the supply of the power supply voltage is restarted, the memory device can be returned to the same state as that before the power supply is stopped. Therefore, the power supply can be stopped even for a short time in the processor or one or a plurality of logic circuits included in the processor, resulting in lower power consumption.

Although the memory element 1200 is used in a CPU, the memory element 1200 can also be used in an LSI such as a digital signal processor (DSP), a custom LSI, or a programmable logic device (PLD), and a radio frequency identification (RF-ID).

<Display Device>

The following shows configuration examples of a display device of one embodiment of the present invention.

Configuration Example

FIG. 28A is a top view of a display device of one embodiment of the present invention. FIG. 28B illustrates a pixel circuit where a liquid crystal element is used for a pixel of a display device of one embodiment of the present invention. FIG. 28C illustrates a pixel circuit where an organic EL element is used for a pixel of a display device of one embodiment of the present invention.

Any of the above-described transistors can be used as a transistor used for the pixel. Here, an example in which an n-channel transistor is used is shown. Note that a transistor manufactured through the same steps as the transistor used for the pixel may be used for a driver circuit. Thus, by using any of the above-described transistors for a pixel or a driver circuit, the display device can have high display quality and/or high reliability.

FIG. 28A illustrates an example of a top view of an active matrix display device. A pixel portion 5001, a first scan line driver circuit 5002, a second scan line driver circuit 5003, and a signal line driver circuit 5004 are provided over a substrate 5000 in the display device. The pixel portion 5001 is electrically connected to the signal line driver circuit 5004 through a plurality of signal lines and is electrically connected to the first scan line driver circuit 5002 and the second scan line driver circuit 5003 through a plurality of scan lines. Pixels including display elements are provided in respective regions divided by the scan lines and the signal lines. The substrate 5000 of the display device is electrically connected to a timing control circuit (also referred to as a controller or a control IC) through a connection portion such as a flexible printed circuit (FPC).

The first scan line driver circuit 5002, the second scan line driver circuit 5003, and the signal line driver circuit 5004 are formed over the substrate 5000 where the pixel portion 5001 is formed. Therefore, a display device can be manufactured at cost lower than that in the case where a driver circuit is separately formed. Furthermore, in the case where a driver circuit is separately formed, the number of wiring connections is increased. By providing the driver circuit over the substrate 5000, the number of wiring connections can be reduced. Accordingly, the reliability and/or yield can be improved.

[Liquid Crystal Display Device]

FIG. 28B illustrates an example of a circuit configuration of the pixel. Here, a pixel circuit which is applicable to a pixel of a VA liquid crystal display device, or the like is illustrated.

This pixel circuit can be applied to a structure in which one pixel includes a plurality of pixel electrodes. The pixel electrodes are connected to different transistors, and the transistors can be driven with different gate signals. Accordingly, signals applied to individual pixel electrodes in a multi-domain pixel can be controlled independently.

A gate wiring 5012 of a transistor 5016 and a gate wiring 5013 of a transistor 5017 are separated so that different gate signals can be supplied thereto. In contrast, a source or drain electrode 5014 functioning as a data line is shared by the transistors 5016 and 5017. Any of the above-described transistors can be used as appropriate as each of the transistors 5016 and 5017. Thus, the liquid crystal display device can have high display quality and/or high reliability.

The shapes of a first pixel electrode electrically connected to the transistor 5016 and a second pixel electrode electrically connected to the transistor 5017 are described. The first pixel electrode and the second pixel electrode are separated by a slit. The first pixel electrode has a V shape and the second pixel electrode is provided so as to surround the first pixel electrode.

A gate electrode of the transistor 5016 is electrically connected to the gate wiring 5012, and a gate electrode of the transistor 5017 is electrically connected to the gate wiring 5013. When different gate signals are supplied to the gate wiring 5012 and the gate wiring 5013, operation timings of the transistor 5016 and the transistor 5017 can be varied. As a result, alignment of liquid crystals can be controlled.

Furthermore, a capacitor may be formed using a capacitor wiring 5010, a gate insulator functioning as a dielectric, and a capacitor electrode electrically connected to the first pixel electrode or the second pixel electrode.

The multi-domain pixel includes a first liquid crystal element 5018 and a second liquid crystal element 5019. The first liquid crystal element 5018 includes the first pixel electrode, a counter electrode, and a liquid crystal layer therebetween. The second liquid crystal element 5019 includes the second pixel electrode, a counter electrode, and a liquid crystal layer therebetween.

Note that a pixel circuit in the display device of one embodiment of the present invention is not limited to that shown in FIG. 28B. For example, a switch, a resistor, a capacitor, a transistor, a sensor, a logic circuit, or the like may be added to the pixel circuit shown in FIG. 28B.

[Organic EL Display Device]

FIG. 28C illustrates another example of a circuit configuration of the pixel. Here, a pixel structure of a display device using an organic EL element is shown.

In an organic EL element, by application of voltage to a light-emitting element, electrons are injected from one of a pair of electrodes included in the organic EL element and holes are injected from the other of the pair of electrodes, into a layer containing a light-emitting organic compound; thus, current flows. The electrons and holes are recombined, and thus, the light-emitting organic compound is excited. The light-emitting organic compound returns to a ground state from the excited state, thereby emitting light. Owing to such a mechanism, this light-emitting element is referred to as a current-excitation light-emitting element.

FIG. 28C illustrates an example of a pixel circuit. Here, one pixel includes two re-channel transistors. Note that any of the above-described transistors can be used as the re-channel transistors. Furthermore, digital time grayscale driving can be employed for the pixel circuit.

The configuration of the applicable pixel circuit and operation of a pixel employing digital time grayscale driving will be described.

A pixel 5020 includes a switching transistor 5021, a driver transistor 5022, a light-emitting element 5024, and a capacitor 5023. A gate electrode of the switching transistor 5021 is connected to a scan line 5026, a first electrode (one of a source electrode and a drain electrode) of the switching transistor 5021 is connected to a signal line 5025, and a second electrode (the other of the source electrode and the drain electrode) of the switching transistor 5021 is connected to a gate electrode of the driver transistor 5022. The gate electrode of the driver transistor 5022 is connected to a power supply line 5027 through the capacitor 5023, a first electrode of the driver transistor 5022 is connected to the power supply line 5027, and a second electrode of the driver transistor 5022 is connected to a first electrode (a pixel electrode) of the light-emitting element 5024. A second electrode of the light-emitting element 5024 corresponds to a common electrode 5028. The common electrode 5028 is electrically connected to a common potential line provided over the same substrate.

As each of the switching transistor 5021 and the driver transistor 5022, any of the above-described transistors can be used as appropriate. In this manner, an organic EL display device having high display quality and/or high reliability can be provided.

The potential of the second electrode (the common electrode 5028) of the light-emitting element 5024 is set to be a low power supply potential. Note that the low power supply potential is lower than a high power supply potential supplied to the power supply line 5027. For example, the low power supply potential can be GND, 0 V, or the like. The high power supply potential and the low power supply potential are set to be higher than or equal to the forward threshold voltage of the light-emitting element 5024, and the difference between the potentials is applied to the light-emitting element 5024, whereby current is supplied to the light-emitting element 5024, leading to light emission. The forward voltage of the light-emitting element 5024 refers to a voltage at which a desired luminance is obtained, and includes at least forward threshold voltage.

Note that gate capacitance of the driver transistor 5022 may be used as a substitute for the capacitor 5023 in some cases, so that the capacitor 5023 can be omitted. The gate capacitance of the driver transistor 5022 may be formed between the channel formation region and the gate electrode.

Next, a signal input to the driver transistor 5022 is described. In the case of a voltage-input voltage driving method, a video signal for turning on or off the driver transistor 5022 is input to the driver transistor 5022. In order for the driver transistor 5022 to operate in a linear region, voltage higher than the voltage of the power supply line 5027 is applied to the gate electrode of the driver transistor 5022. Note that voltage higher than or equal to voltage which is the sum of power supply line voltage and the threshold voltage V_(th) of the driver transistor 5022 is applied to the signal line 5025.

In the case of performing analog grayscale driving, a voltage higher than or equal to a voltage which is the sum of the forward voltage of the light-emitting element 5024 and the threshold voltage V_(th) of the driver transistor 5022 is applied to the gate electrode of the driver transistor 5022. A video signal by which the driver transistor 5022 is operated in a saturation region is input, so that current is supplied to the light-emitting element 5024. In order for the driver transistor 5022 to operate in a saturation region, the potential of the power supply line 5027 is set higher than the gate potential of the driver transistor 5022. When an analog video signal is used, it is possible to supply current to the light-emitting element 5024 in accordance with the video signal and perform analog grayscale driving.

Note that in the display device of one embodiment of the present invention, a pixel configuration is not limited to that shown in FIG. 28C. For example, a switch, a resistor, a capacitor, a sensor, a transistor, a logic circuit, or the like may be added to the pixel circuit shown in FIG. 28C.

In the case where any of the above-described transistors is used for the circuit shown in FIGS. 28A to 28C, the source electrode (the first electrode) is electrically connected to the low potential side and the drain electrode (the second electrode) is electrically connected to the high potential side. Furthermore, the potential of the first gate electrode may be controlled by a control circuit or the like and the potential described above as an example, e.g., a potential lower than the potential applied to the source electrode, may be input to the second gate electrode.

For example, in this specification and the like, a display element, a display device which is a device including a display element, a light-emitting element, and a light-emitting device which is a device including a light-emitting element can employ a variety of modes or can include a variety of elements. A display element, a display device, a light-emitting element, or a light-emitting device includes, for example, at least one of an EL element (e.g., an EL element including organic and inorganic materials, an organic EL element, or an inorganic EL element), an LED (e.g., a white LED, a red LED, a green LED, or a blue LED), a transistor (a transistor which emits light depending on current), an electron emitter, a liquid crystal element, electronic ink, an electrophoretic element, a grating light valve (GLV), a plasma display panel (PDP), a micro electro mechanical system (MEMS), a digital micromirror device (DMD), a digital micro shutter (DMS), an interferometric modulator display (IMOD) element, an electrowetting element, a piezoelectric ceramic display, and a display element including a carbon nanotube. Other than the above, display media whose contrast, luminance, reflectivity, transmittance, or the like is changed by electrical or magnetic effect may be included. Note that examples of a display device having an EL element include an EL display. Examples of a display device having an electron emitter include a field emission display (FED) and an SED-type flat panel display (SED: surface-conduction electron-emitter display). Examples of a display device having a liquid crystal element include a liquid crystal display (e.g., a transmissive liquid crystal display, a transflective liquid crystal display, a reflective liquid crystal display, a direct-view liquid crystal display, or a projection liquid crystal display). Examples of a display device having electronic ink or an electrophoretic element include electronic paper.

A color layer (also referred to as a color filter) may be used in order to obtain a full-color display device in which white light (W) for a backlight (e.g., an organic EL element, an inorganic EL element, an LED, or a fluorescent lamp) is used. As the color layer, red (R), green (G), blue (B), yellow (Y), or the like may be combined as appropriate, for example. With the use of the color layer, higher color reproducibility can be obtained than in the case without the color layer. In this case, by providing a region with the color layer and a region without the color layer, white light in the region without the color layer may be directly utilized for display. By partly providing the region without the color layer, a decrease in luminance due to the color layer can be suppressed, and 20% to 30% of power consumption can be reduced in some cases when an image is displayed brightly. Note that in the case where full-color display is performed using a self-luminous element such as an organic EL element or an inorganic EL element, elements may emit light of their respective colors R, G, B, Y, and W. By using a self-luminous element, power consumption can be further reduced as compared to the case of using the color layer in some cases.

<Module>

A display module using a semiconductor device of one embodiment of the present invention is described below with reference to FIG. 29.

In a display module 8000 in FIG. 29, a touch panel 8004 connected to an FPC 8003, a cell 8006 connected to an FPC 8005, a backlight unit 8007, a frame 8009, a printed board 8010, and a battery 8011 are provided between an upper cover 8001 and a lower cover 8002. Note that the backlight unit 8007, the battery 8011, the touch panel 8004, and the like are not provided in some cases.

The semiconductor device of one embodiment of the present invention can be used for the cell 8006, for example.

The shapes and sizes of the upper cover 8001 and the lower cover 8002 can be changed as appropriate in accordance with the sizes of the touch panel 8004 and the cell 8006.

The touch panel 8004 can be a resistive touch panel or a capacitive touch panel and may be formed to overlap with the cell 8006. A counter substrate (sealing substrate) of the cell 8006 can have a touch panel function. A photosensor may be provided in each pixel of the cell 8006 so that an optical touch panel is obtained. An electrode for a touch sensor may be provided in each pixel of the cell 8006 so that a capacitive touch panel is obtained.

The backlight unit 8007 includes a light source 8008. The light source 8008 may be provided at an end portion of the backlight unit 8007 and a light diffusing plate may be used.

The frame 8009 may protect the cell 8006 and also function as an electromagnetic shield for blocking electromagnetic waves generated by the operation of the printed board 8010. The frame 8009 may function as a radiator plate.

The printed board 8010 has a power supply circuit and a signal processing circuit for outputting a video signal and a clock signal. As a power source for supplying power to the power supply circuit, an external commercial power source or a power source using the battery 8011 provided separately may be used. The battery 8011 can be omitted in the case of using a commercial power source.

The display module 8000 can be additionally provided with a member such as a polarizing plate, a retardation plate, or a prism sheet

<Electronic Device>

The semiconductor device of one embodiment of the present invention can be used for display devices, personal computers, or image reproducing devices provided with recording media (typically, devices which reproduce the content of recording media such as digital versatile discs (DVDs) and have displays for displaying the reproduced images). Other examples of electronic devices that can be equipped with the semiconductor device of one embodiment of the present invention are mobile phones, game machines including portable game consoles, portable data appliances, e-book readers, cameras such as video cameras and digital still cameras, goggle-type displays (head mounted displays), navigation systems, audio reproducing devices (e.g., car audio systems and digital audio players), copiers, facsimiles, printers, multifunction printers, automated teller machines (ATM), and vending machines. FIGS. 30A to 30F illustrate specific examples of these electronic devices.

FIG. 30A illustrates a portable game console including a housing 901, a housing 902, a display portion 903, a display portion 904, a microphone 905, a speaker 906, an operation key 907, a stylus 908, and the like. Although the portable game console in FIG. 30A has the two display portions 903 and 904, the number of display portions included in a portable game console is not limited to this.

FIG. 30B illustrates a portable data terminal including a first housing 911, a second housing 912, a first display portion 913, a second display portion 914, a joint 915, an operation key 916, and the like. The first display portion 913 is provided in the first housing 911, and the second display portion 914 is provided in the second housing 912. The first housing 911 and the second housing 912 are connected to each other with the joint 915, and the angle between the first housing 911 and the second housing 912 can be changed with the joint 915. An image on the first display portion 913 may be switched depending on the angle between the first housing 911 and the second housing 912 at the joint 915. A display device with a position input function may be used as at least one of the first display portion 913 and the second display portion 914. Note that the position input function can be added by providing a touch panel in a display device. Alternatively, the position input function can be added by provision of a photoelectric conversion element called a photosensor in a pixel portion of a display device.

FIG. 30C illustrates a laptop personal computer, which includes a housing 921, a display portion 922, a keyboard 923, a pointing device 924, and the like.

FIG. 30D illustrates the electric refrigerator-freezer including a housing 931, a door for a refrigerator 932, a door for a freezer 933, and the like.

FIG. 30E illustrates a video camera, which includes a first housing 941, a second housing 942, a display portion 943, operation keys 944, a lens 945, a joint 946, and the like. The operation keys 944 and the lens 945 are provided for the first housing 941, and the display portion 943 is provided for the second housing 942. The first housing 941 and the second housing 942 are connected to each other with the joint 946, and the angle between the first housing 941 and the second housing 942 can be changed with the joint 946. Images displayed on the display portion 943 may be switched in accordance with the angle at the joint 946 between the first housing 941 and the second housing 942.

FIG. 30F illustrates an ordinary vehicle including a car body 951, wheels 952, a dashboard 953, lights 954, and the like.

Example 1

In this example, samples each including a semiconductor of one embodiment of the present invention were fabricated and physical properties thereof were evaluated.

<Planarity>

First of all, the planarity of the semiconductor was evaluated. A method for fabricating the samples will be described below.

First, a silicon substrate was prepared as a substrate.

Next, a 100-nm-thick silicon oxide film was formed over the silicon substrate by a thermal oxidation method.

Next, a 300-nm-thick silicon oxide film was formed by a sputtering method. Then, planarization treatment was performed on a top surface of the silicon oxide film by a CMP method. Note that by the planarization treatment, the thickness of the silicon oxide film was reduced by approximately 12 nm and the average surface roughness of the top surface became less than or equal to 0.2 nm.

Next, a 20-nm-thick first semiconductor was formed by a sputtering method. The first semiconductor was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:4 [atomic ratio]) target. Note that an In—Ga—Zn oxide layer formed using the In—Ga—Zn oxide (In:Ga:Zn=1:3:4 [atomic ratio]) target is also denoted by <134>. The substrate temperature in the film formation was 200° C., 250° C., 300° C., or 350° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 33%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

Alternatively, the first semiconductor was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:2 [atomic ratio]) target. Note that an In—Ga—Zn oxide layer formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:2 [atomic ratio]) target is also denoted by <132>. The substrate temperature in the film formation was 200° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 33%, the pressure was 0.4 Pa, and the DC power was 0.5 kW. Next, a 15-nm-thick second semiconductor was formed by a sputtering method in some samples. The second semiconductor was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:1:1 [atomic ratio]) target. Note that an In—Ga—Zn oxide layer formed using an In—Ga—Zn oxide (In:Ga:Zn=1:1:1 [atomic ratio]) target is also denoted by <111>. The substrate temperature in the film formation was 300° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 33%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

Next, RMS roughness, R_(α), and P−V were measured using a scanning probe microscope SPA-500 manufactured by SII Nano Technology Inc. The measurement area was 1 μm×1 μm, and the number of data was X=512 and Y=512.

FIGS. 35A to 35C show the results. It was found that as the substrate temperature was increased, the RMS roughness was increased. In particular, such a tendency was apparent in a stacked-layer structure in which <111> was arranged over <134> (also denoted by <134>\<111>). Furthermore, it was found that in a <132> single layer and a stacked-layer structure in which <111> was arranged over <132> (also denoted by <132>\<111>), RMS roughness was less than or equal to 0.4 nm.

Similar tendencies were found in R_(α) and RMS roughness. It was found that in the <132> single layer and <132>\<111>, R_(α) was less than or equal to 0.3 nm.

In <134>\<111>, as the substrate temperature was increased, P−V was increased. On the other hand, in the <134> single layer, P−V was constant regardless of the substrate temperature.

Next, among the above samples, RMS roughness, R_(α), and P−V of the samples having a structure similar to that of the <134> single layer and fabricated under conditions different from those of the <134> single layer only in the first semiconductor were measured. Note that the first semiconductor was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:4 [atomic ratio]) target. The substrate temperature in the film formation was 200° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 11%, 33%, 50%, or 100%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

FIGS. 36A to 36C show the results. It was found that as the percentage of an oxygen gas was increased, RMS roughness was increased. Furthermore, it was found that in the samples fabricated under the conditions where the percentages of an oxygen gas were 11% and 33%, RMS roughness was less than or equal to 0.5 nm.

Similar tendencies were found in R_(α) and RMS roughness. Furthermore, it was found that in the samples fabricated under the conditions where the percentages of an oxygen gas were 11% and 33%, R_(α) was less than or equal to 0.4 nm.

Furthermore, P−V was approximately greater than or equal to 4 nm and less than or equal to 6 nm.

<Crystallinity>

Next, crystallinity of the semiconductor was evaluated.

The structure of a sample was similar to that of the sample of the <134> single layer used to evaluate planarity. That is, the sample includes a silicon substrate, a 100-nm-thick silicon oxide film formed on the silicon substrate surface by a thermal oxidation method, a silicon oxide film which was formed over the silicon oxide film by a sputtering method and whose thickness planarized by a CMP method (including a reduction in thickness by a CMP method) was 288 nm, and a 20-nm-thick semiconductor <134> formed over the silicon oxide film by a sputtering method.

For <134>, the substrate temperature in the film formation was room temperature (approximately 25° C., also denoted by RT), 100° C., 200° C., 250° C., 300° C., or 350° C. For each of the substrate temperature conditions, samples with the percentages of an oxygen gas of 11%, 33%, 50%, and 100% were prepared.

The crystallinity was measured by an out-of-plane method using an X-ray diffractometer D8 ADVANCE manufactured by Bruker AXS.

FIG. 37 shows the results. A peak showing orientation was observed at 20 around 30° in the samples except all of the samples fabricated at room temperature and the samples fabricated at 100° C. in which the percentages of an oxygen gas were 11% and 33%. The sample having the peak is assumed to include a crystal of an In—Ga—Zn oxide having c-axis alignment. Thus, the sample is assumed to be a CAAC-OS.

Next, the samples fabricated at 200° C. in which the percentages of an oxygen gas were 11%, 33%, and 100% were subjected to nanobeam electron diffraction with a probe diameter of 1 nm, and the proportion of CAAC thereof was measured. For the measurement method of the proportion of CAAC, the above embodiment is referred to.

Here, transmission electron diffraction patterns were obtained by scanning a top surface of each sample for 60 seconds at a rate of 5 nm/s. The observed diffraction patterns were converted into still images every 0.5 seconds to obtain the proportion of CAAC.

FIG. 38 shows the proportion of CAAC in each sample. The proportion of CAAC of <134> in which the percentage of an oxygen gas was 11% was 91.8% (the proportion of non-CAAC was 8.2%). The proportion of CAAC of <134> in which the percentage of an oxygen gas was 33% was 95.0% (the proportion of non-CAAC was 5.0%). The proportion of CAAC of <134> in which the percentage of an oxygen gas was 100% was 100.0% (the proportion of non-CAAC was 0.0%). Thus, these samples were found to be CAAC-OS. Furthermore, it was found that the higher the percentage of an oxygen gas was, the lower the proportion of non-CAAC was (the higher the proportion of CAAC was). In other words, the lower the percentage of an oxygen gas was, the higher the proportion of non-CAAC was (the lower the proportion of CAAC was).

Most of diffraction patterns different from that of a CAAC-OS are diffraction patterns similar to that of an nc-OS.

Next, XRD intensity was increased by increasing the thickness of <134> to 100 nm, and then the crystallinity was compared again. Note that the other conditions were not changed.

FIG. 39 shows results. The peak intensity at 2θ around 30° was larger than that of the sample with <134> of the thickness of 20 nm. Therefore, even in the samples which were each fabricated at room temperature and in each of which a peak was not able to be observed in the case of the thickness of 20 nm, peaks were observed under the conditions in which the percentages of an oxygen gas were 50% and 100%.

Here, FIG. 40 shows XRD intensity at a peak around 30° due to CAAC (also denoted by XRD intensity|CAAC) in each sample. Note that XRD intensity was obtained by subtracting a background spectrum attributed to other components, e.g., a substrate to separate only a peak and approximating the peak by Lorentz function.

The above evaluation of crystallinity indicates that a certain threshold value causes formation of a CAAC-OS. In other words, in order to form a <134> single layer which is a high-quality CAAC-OS, for example, the substrate temperature in the film formation was higher than or equal to 100° C., preferably higher than or equal to 200° C. Note that it was found that there is no guarantee that the higher the substrate temperature in the film formation was and the higher the percentage of an oxygen gas was, the higher the crystallinity was. Therefore, it is important to select a combination of conditions as appropriate depending on desired crystallinity.

<Film Density>

Next, film density of the semiconductor was evaluated.

The structure of a sample was similar to that of the sample of the <134> single layer used to evaluate crystallinity. That is, the sample includes a silicon substrate, a 100-nm-thick silicon oxide film formed on the silicon substrate surface by a thermal oxidation method, a silicon oxide film which was formed over the silicon oxide film by a sputtering method and whose thickness planarized by a CMP method (including a reduction in thickness by a CMP method) was 288 nm, and a 20-nm-thick semiconductor <134> formed over the silicon oxide film by a sputtering method.

For the film density measurement, an X-ray diffractometer, D8 ADVANCE manufactured by Bruker AXS was used and X-ray reflection (XRR) was employed. The film density was obtained with factors other than interface layers on a bottom surface and a top surface.

FIG. 41 shows results. The film density of the <134> single layer was found to be in a range from 5.5 g/cm³ to 6.4 g/cm³. There is a tendency that the higher the percentage of an oxygen gas in the film formation is and the higher the substrate temperature in the film formation is, the higher the film density is in many cases.

Next, the horizontal axis represents film density and the vertical axis represents XRD intensity|CAAC, and data (24 points) of FIG. 40 and FIG. 41 were plotted (see FIG. 42). FIG. 42 shows an approximate straight line and the square of a correlation coefficient R (also represented as R²). It was found that there is a positive correlation between the film density and the crystallinity of <134>. In other words, it was found that the higher the crystallinity was, the higher the film density was, and that the higher the film density was, the higher the crystallinity was.

<Diffusion of Oxygen>

Next, diffusion of oxygen in the semiconductor was examined. A method for fabricating samples will be described below.

First, a square-shaped silicon substrate with a length of 126.6 mm was prepared as a substrate.

Next, a 100-nm-thick silicon oxide film was formed over the silicon substrate by a thermal oxidation method.

Next, a 300-nm-thick silicon oxide film was formed by a sputtering method. The silicon oxide film was formed using a synthesized quartz target. Note that ¹⁸O₂ was used as the oxygen gas, and the percentage of the oxygen gas [O₂/(O₂+Ar)] was 50%. Next, planarization treatment was performed on a top surface of the silicon oxide film by a CMP method. By the planarization treatment, the thickness of the silicon oxide film was reduced by approximately 12 nm and the average surface roughness of the top surface was less than or equal to 0.2 nm.

Next, by a sputtering method, a 50-nm-thick semiconductor was formed. The semiconductor was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:4 [atomic ratio]) target. The substrate temperature in the film formation was 100° C., 200° C., 250° C., or 300° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 11%, 33%, 50%, or 100%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

Next, heat treatment was performed. The heat treatment was performed in a nitrogen gas atmosphere for an hour and then in an oxygen gas atmosphere for an hour. The temperature of the heat treatment was 350° C., 400° C., or 450° C.

Diffusion of oxygen was evaluated by measuring the concentration distribution of ¹⁸O in the thickness direction in <134> with a PHI ADEPT-1010 quadrupole SIMS instrument manufactured by ULVAC-PHI, Inc. By measuring diffusion of ¹⁸O to <134> from the silicon oxide film containing ¹⁸O which is an isotope of an oxygen, diffusion of oxygen can be evaluated even in a layer containing oxygen as its main component.

FIG. 43 shows concentration distribution of ¹⁸O of each sample in the thickness direction at substrate temperatures in film formation (also referred to as film formation temperatures). The percentage of an oxygen gas in the film formation was 33%. FIG. 44 shows the percentage of an oxygen gas in the film formation and concentration distribution of ¹⁸O of each sample in the thickness direction. Note that the substrate temperature in the film formation was 200° C. FIG. 43 and FIG. 44 show concentration distribution of ¹⁸O of a sample which was not subjected to heat treatment (also referred to as as-depo) in the thickness direction for comparison.

Next, a procedure for obtaining a diffusion length of ¹⁸O in <134> diffused from the silicon oxide film by using the concentration distribution of ¹⁸O in the thickness direction is described with reference to FIG. 45.

As illustrated in FIG. 45 and the like, the silicon oxide film (also expressed as SiO_(x) ¹⁸O) formed using ¹⁸O₂ has a region whose concentration distribution of ¹⁸O in the thickness direction is substantially constant. Here, the maximum value of the ¹⁸O concentration in the silicon oxide film is shown by a broken line in the diagram. Next, a value obtained by multiplying the maximum value of the ¹⁸O concentration in the silicon oxide film by 1/e is shown by a broken line in the diagram. The depth at which this value was obtained is regarded as a boundary between the silicon oxide film and <134>. Note that in this example, ¹⁸O concentration in the region was not quantified.

In addition, <134> has a region whose concentration distribution of ¹⁸O in the thickness direction is substantially constant. There is a high possibility that the ¹⁸O concentration in the region is the ¹⁸O concentration originally in <134> regardless of diffusion of ¹⁸O. Therefore, it might be difficult to evaluate diffusion of ¹⁸O of a sample not having the region. In order to form the region, the thickness of <134> may be changed as appropriate.

In this example, for evaluation, a region having the ¹⁸O concentration ranging from the value obtained by multiplying the maximum value of the ¹⁸O concentration by 1/e to the depth at which the ¹⁸O concentration is 2×10²⁰ atoms/cm³ (shown by a broken line in the drawing) is regarded as a diffusion region of ¹⁸O into <134>.

In other words, the depth shown by a two-headed arrow in FIG. 45 is a diffusion length of ¹⁸O in <134>.

Through this procedure, a diffusion length of ¹⁸O in each sample which is shown in FIG. 43 and FIG. 44 was obtained. Table 2 shows results.

TABLE 2 Diffusion length [nm] Film formation Percentage of as- temperature oxygen gas depo 350° C. 400° C. 450° C. 100° C. 33% 2.2 4.4 7.3 12.4 200° C. 33% 2.9 3.6 5.8 8.7 250° C. 33% 2.9 3.9 4.8 8.7 300° C. 33% 2.9 2.9 4.8 7.7 200° C. 11% 1.8 3.6 5.4 9.6 200° C. 33% 2.4 3.0 4.8 7.8 200° C. 50% 2.4 3.0 3.6 7.2 200° C. 100%  2.4 3.0 4.2 6.0

Next, FIG. 46 shows plotted data; the horizontal axis represents film density and the vertical axis represents a diffusion length. Note that the above film density is utilized as the film density. Thus, the thickness of <134> is different from that in the sample used for evaluation of oxygen diffusion. Although the film density is changed by heat treatment after the film formation in some cases, it is not considered in this example.

In FIG. 46, a relationship between the film density and the diffusion length in the sample of as-depo cannot be found. Therefore, it was found that a thickness of a mixed region of silicon oxide and <134> formed at the time of formation of <134> hardly depends on the film density of <134>. The thickness of the mixed region hardly depends on formation conditions of <134>.

In the case where heat treatment was performed at 350° C., 400° C., and 450° C., as the film density of the sample became lower, the diffusion length was increased. In other words, as the film density became lower, oxygen was more easily diffused.

In this example, properties of a semiconductor were evaluated in a diversified manner. As a result, a relationship between planarity and crystallinity, a relationship between crystallinity and film density, a relationship between film density and oxygen diffusion, and the like were observed.

Example 2

In this example, transistors of one embodiment of the present invention were fabricated and the electrical characteristics thereof were evaluated. A method for fabricating the samples will be described below. A structure of the transistor fabricated in this example is different from the structure illustrated in FIGS. 1A and 1B in that the conductor 413 functioning as a second gate electrode is not provided. That is, the structure is similar to the structure illustrated in FIG. 5B. The ordinal numbers used in FIGS. 1A and 1B, FIG. 5B, FIGS. 12A and 12B, FIGS. 13A, 13B, 13C1, and 13C2, FIGS. 14A and 14B, and the like are used below for description.

First, a silicon substrate was prepared as the substrate 400.

Next, a 100-nm-thick silicon oxide film was formed over the silicon substrate by a thermal oxidation method.

Next, a 300-nm-thick silicon oxynitride film was formed by a PECVD method. Then, planarization treatment was performed on a top surface of the silicon oxynitride film by a CMP method. Note that by the planarization treatment, the thickness of the silicon oxynitride film was reduced by approximately 12 nm and the average surface roughness of the top surface became less than or equal to 0.2 nm.

Next, oxygen was added to the silicon oxynitride film by an ion implantation method. The ion implantation method was employed at an acceleration voltage of 60 kV and at a concentration of ¹⁶O⁺ ions of 2×10¹⁶ ions/cm².

The silicon oxide film and the silicon oxynitride film correspond to the insulator 402.

Next, by a sputtering method, a stacked-layer structure of a 20-nm-thick semiconductor corresponding to the semiconductor 406 a and a 15-nm-thick semiconductor corresponding to the semiconductor 406 b was formed.

The semiconductor corresponding to the semiconductor 406 a was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:4 [atomic ration]) target. An In—Ga—Zn oxide layer formed using the In—Ga—Zn oxide (In:Ga:Zn=1:3:4 [atomic ratio]) target is also denoted by <134>. Note that the substrate temperature in the film formation was 200° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 11%, 33%, 50%, or 100%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

The semiconductor corresponding to the semiconductor 406 b was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:1:1 [atomic ratio]) target. Note that an In—Ga—Zn oxide layer formed using an In—Ga—Zn oxide (In:Ga:Zn=1:1:1 [atomic ratio]) target is also denoted by <111>. The substrate temperature in the film formation was 300° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 33%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

Next, heat treatment was performed. The heat treatment was performed in a nitrogen gas atmosphere for an hour and then in an oxygen gas atmosphere for an hour. The temperature of the heat treatment was 450° C.

Next, a 100-nm-thick tungsten film corresponding to the conductor 416 a and the conductor 416 b was formed by a sputtering method.

Next, a 5-nm-thick semiconductor corresponding to the semiconductor 406 c was formed by a sputtering method, a 20-nm-thick silicon oxynitride film corresponding to the insulator 412 was formed by a PECVD method, a 30-nm-thick tantalum nitride film was formed by a sputtering method, and a 135-nm-thick tungsten film was formed by a sputtering method. Note that a stacked-layer structure of the tantalum nitride film and the tungsten film corresponds to the conductor 404. The semiconductor corresponding to the semiconductor 406 c was formed using an In—Ga—Zn oxide (In:Ga:Zn=1:3:2 [atomic ratio]) target (also denoted by <132>). Note that the substrate temperature in the film formation was 200° C., the percentage of an oxygen gas [O₂/(O₂+Ar)] was 33%, the pressure was 0.4 Pa, and the DC power was 0.5 kW.

Next, a 70-nm-thick aluminum oxide film corresponding to the insulator 408 was formed by a sputtering method and a 300-nm-thick silicon oxynitride film corresponding to the insulator 418 was formed by a PECVD method.

Next, heat treatment was performed. The heat treatment was performed in an oxygen gas atmosphere for an hour. The heat treatment temperature was 400° C.

A terminal portion was added to the transistor fabricated through the above process, and electrical characteristics thereof were measured.

<Vg-Id Characteristics>

First, a change in drain current Id when gate voltage Vg is varied in a state where drain voltage is applied (also referred to as Vg-Id characteristics) was measured. The transistor with a channel length L of 0.45 μm and a channel width W (SCW) of 1 μm was used.

Applied drain voltage Vd was 0.1 V or 3 V. The measurement was performed at 25 points evenly provided on a substrate surface at each drain voltage. Note that some irregular points are removed from the measurement results in some cases.

FIG. 47 shows results. By analyzing the results in FIG. 47, field-effect mobility (also referred to as μ_(FE)), a subthreshold swing value (also referred to as an S value), and a shift value (also referred to as Shift) were obtained. The field-effect mobility and the subthreshold swing value were obtained from Vg-Id characteristics at a drain voltage Vd of 0.1 V. The shift value was obtained from Vg-Id characteristics at a drain voltage Vd of 3 V.

In a curve showing Vg-Id characteristics, the shift value is defined as a gate voltage Vg at a point of intersection of an extrapolated tangent line having the highest inclination with a drain current Id of 1×10⁻¹² A.

FIG. 48 shows a relationship between the percentage of an oxygen gas in formation of <134> and the above electrical characteristics. A line connecting the plots shown in FIG. 48 is a line connecting median values.

From FIG. 48, it was found that the smaller the percentage of an oxygen gas in formation of <134> was, the higher the field-effect mobility was. Furthermore, it was found that the smaller the percentage of an oxygen gas in the film formation was, the smaller the subthreshold swing value was. In addition, the smaller the percentage of an oxygen gas in the film formation was, the smaller the shift value was; however, normally-off characteristics were maintained.

In this example, it was found that the transistor with the lowest percentage of an oxygen gas in formation of <134> (11%) had favorable electrical characteristics. As described in Example 1, <134> was found to have improved planarity as the percentage of an oxygen gas in the film formation was smaller. Thus, as shown in the model in FIG. 4B, there is a possibility that electrical characteristics are improved by reducing physical unevenness. In addition, <134> in which the percentage of an oxygen gas in the film formation is small has a relatively high oxygen-transmitting property; thus, oxygen vacancies in <111> can be reduced as compared with the condition in which the percentage of an oxygen gas is large. In other words, by decreasing the defect state density due to oxygen vacancies, there is a possibility that electrical characteristics are improved.

<Reliability>

Next, reliability of a transistor was evaluated. The reliability was evaluated by gate BT stress tests.

A measurement method in a positive gate BT stress test (+GBT) is described. To measure electrical characteristics in the initial state (a state before stress application) of a target transistor of the positive gate BT stress test, a change in drain current Id, that is, Vg-Id characteristics were measured under the following conditions: the substrate temperature was 40° C., the drain voltage Vd was 0.1 V or 3 V, and the gate voltage was swept from −3 V to +3 V.

Next, the substrate temperature was increased to 150° C., and then, the drain voltage Vd of the transistor was set to 0 V. After that, a gate voltage of 3.3 V was applied so that the intensity of the electric field applied to the insulator corresponding to the insulator 412 was 1.65 MV/cm. The gate voltage was kept being applied for 3600 seconds.

Note that a gate voltage of −3.3 V was applied in a negative gate BT stress test (−GBT).

FIG. 49 and FIG. 50 show the Vg-Id characteristics of each sample before and after the gate BT stress tests. FIG. 49 shows results of gate BT stress tests of transistors with a channel length L of 0.45 μm and a channel width W (SCW) of 1 μm and FIG. 50 shows results of gate BT stress tests of transistors with a channel length L of 0.45 μm and a channel width W (SCW) of 10 μm. In each graph of FIG. 49 and FIG. 50, solid lines represent the electrical characteristics before the gate BT stress test (before GBT), and broken lines represent the electrical characteristics after the gate BT stress test (after GBT). Moreover, in each of FIG. 49 and FIG. 50, the top graph shows the Vg-Id characteristics before and after a positive gate BT stress test, and the bottom graph shows the Vg-Id characteristics before and after a negative gate BT stress test.

Table 3 shows shifts in threshold voltage (ΔVth) and a shift value (ΔShift) between before and after the gate BT stress tests obtained in FIG. 49 and FIG. 50. Note that the threshold voltage (Vth) refers to a gate voltage (voltage between a source and a gate) when a channel is formed. In a curve where the horizontal axis represents the gate voltage Vg and the vertical axis represents the square root of drain current Id and where data are plotted (Vg-characteristics), the threshold voltage (Vth) was defined as a gate voltage Vg at a point of intersection of an extrapolated tangent line having the highest inclination with the square root of drain current Id of 0 (Id=0 A).

TABLE 3 +GBT −GBT Percentage of ΔVth ΔShift ΔVth ΔShift W/L oxygen gas [V] [V] [V] [V] W 1 μm 11% 0.49 0.46 0.12 0.13 L 0.45 μm 33% 0.45 0.47 0.12 0.08 50% 0.51 0.56 0.17 0.13 100%  0.49 0.47 0.17 0.08 W 10 μm 11% 0.16 0.17 −0.01 −0.01 L 0.45 μm 33% 0.20 0.19 0.01 −0.01 50% 0.20 0.21 −0.06 −0.04 100%  0.21 0.22 −0.06 −0.03

FIGS. 51A and 51B show results of a gate BT stress test in Table 3. From Table 3 and FIGS. 51A and 51B, it was found that in some cases, the lower the percentage of an oxygen gas in formation of <134> was, the more the reliability tended to be increased.

There is a possibility that the reliability is increased because the state density at <111> and an interface with <111> can be reduced by reducing the percentage of an oxygen gas in the formation of <134>.

This application is based on Japanese Patent Application serial no. 2013-262873 filed with Japan Patent Office on Dec. 19, 2013, the entire contents of which are hereby incorporated by reference. 

What is claimed is:
 1. A semiconductor device comprising: a first insulator; a first oxide semiconductor film over the first insulator; a second oxide semiconductor film over the first oxide semiconductor film; a first conductor and a second conductor over the second oxide semiconductor film; a third oxide semiconductor film in direct contact with a side surface of the first oxide semiconductor film, a top surface and a side surface of the second oxide semiconductor film, a top surface of the first conductor, and a top surface of the second conductor; a second insulator over the third oxide semiconductor film; and a third conductor facing the top surface and the side surface of the second oxide semiconductor film with the second insulator and the third oxide semiconductor film provided therebetween, wherein the thickness of the first oxide semiconductor film is larger than a thickness of the third oxide semiconductor film, and wherein any of ends of the third oxide semiconductor film, the second insulator, and the third conductor does not project in a cross-sectional view.
 2. The semiconductor device according to claim 1, wherein the first insulator comprises an oxygen atom which is capable of being released from the first insulator by a heat treatment.
 3. The semiconductor device according to claim 1, further comprising a third insulator covering at least the first insulator, the first oxide semiconductor film, and the second oxide semiconductor film, wherein the third insulator has a function of blocking oxygen, and wherein the third insulator has a function of blocking hydrogen.
 4. The semiconductor device according to claim 1, wherein the first oxide semiconductor film has a lower electron affinity than the second oxide semiconductor film, and wherein the third oxide semiconductor film has a lower electron affinity than the second oxide semiconductor film.
 5. The semiconductor device according to claim 1, wherein the first oxide semiconductor film has a larger energy gap than the second oxide semiconductor film, and wherein the third oxide semiconductor film has a larger energy gap than the second oxide semiconductor film.
 6. The semiconductor device according to claim 1, wherein the second insulator comprises a region whose hydrogen concentration measured by secondary ion mass spectrometry is lower than 1×10¹⁹ atoms/cm³.
 7. The semiconductor device according to claim 1, further comprising: a third insulator covering at least the first insulator, the first oxide semiconductor film, and the second oxide semiconductor film, and a fourth insulator over the third insulator, wherein the fourth insulator comprises a region whose hydrogen concentration measured by secondary ion mass spectrometry is higher than that of a region of the second oxide semiconductor film.
 8. A semiconductor device comprising: a first insulator; a first oxide semiconductor film over the first insulator; a second oxide semiconductor film over the first oxide semiconductor film; a first conductor and a second conductor over the second oxide semiconductor film; a third oxide semiconductor film in direct contact with a side surface of the first oxide semiconductor film, a top surface and a side surface of the second oxide semiconductor film, a top surface of the first conductor, and a top surface of the second conductor; a second insulator over the third oxide semiconductor film; and a third conductor facing the top surface and the side surface of the second oxide semiconductor film with the second insulator and the third oxide semiconductor film provided therebetween, wherein the thickness of the first oxide semiconductor film is larger than a thickness of the third oxide semiconductor film, and wherein each of the third oxide semiconductor film and the second insulator includes a region not overlapping with the third conductor.
 9. The semiconductor device according to claim 8, wherein the first insulator comprises an oxygen atom which is capable of being released from the first insulator by a heat treatment.
 10. The semiconductor device according to claim 8, further comprising a third insulator covering at least the first insulator, the first oxide semiconductor film, and the second oxide semiconductor film, wherein the third insulator has a function of blocking oxygen, and wherein the third insulator has a function of blocking hydrogen.
 11. The semiconductor device according to claim 8, wherein the first oxide semiconductor film has a lower electron affinity than the second oxide semiconductor film, and wherein the third oxide semiconductor film has a lower electron affinity than the second oxide semiconductor film.
 12. The semiconductor device according to claim 8, wherein the first oxide semiconductor film has a larger energy gap than the second oxide semiconductor film, and wherein the third oxide semiconductor film has a larger energy gap than the second oxide semiconductor film.
 13. The semiconductor device according to claim 8, wherein the second insulator comprises a region whose hydrogen concentration measured by secondary ion mass spectrometry is lower than 1×10¹⁹ atoms/cm³.
 14. The semiconductor device according to claim 8, further comprising: a third insulator covering at least the first insulator, the first oxide semiconductor film, and the second oxide semiconductor film, and a fourth insulator over the third insulator, wherein the fourth insulator comprises a region whose hydrogen concentration measured by secondary ion mass spectrometry is higher than that of a region of the second oxide semiconductor film.
 15. A semiconductor device comprising: a first insulator; a first oxide semiconductor film over the first insulator; a second oxide semiconductor film over the first oxide semiconductor film; a first conductor and a second conductor over the second oxide semiconductor film; a third oxide semiconductor film in direct contact with a side surface of the first oxide semiconductor film, a top surface and a side surface of the second oxide semiconductor film, a top surface of the first conductor, and a top surface of the second conductor; a second insulator over the third oxide semiconductor film; and a third conductor facing the top surface and the side surface of the second oxide semiconductor film with the second insulator and the third oxide semiconductor film provided therebetween, wherein the thickness of the first oxide semiconductor film is larger than a thickness of the third oxide semiconductor film, wherein the third oxide semiconductor film includes a region not overlapping with the third conductor, and wherein the second insulator includes a region not overlapping with the third oxide semiconductor film.
 16. The semiconductor device according to claim 15, wherein the first insulator comprises an oxygen atom which is capable of being released from the first insulator by a heat treatment.
 17. The semiconductor device according to claim 15, further comprising a third insulator covering at least the first insulator, the first oxide semiconductor film, and the second oxide semiconductor film, wherein the third insulator has a function of blocking oxygen, and wherein the third insulator has a function of blocking hydrogen.
 18. The semiconductor device according to claim 15, wherein the first oxide semiconductor film has a lower electron affinity than the second oxide semiconductor film, and wherein the third oxide semiconductor film has a lower electron affinity than the second oxide semiconductor film.
 19. The semiconductor device according to claim 15, wherein the first oxide semiconductor film has a larger energy gap than the second oxide semiconductor film, and wherein the third oxide semiconductor film has a larger energy gap than the second oxide semiconductor film.
 20. The semiconductor device according to claim 15, wherein the second insulator comprises a region whose hydrogen concentration measured by secondary ion mass spectrometry is lower than 1×10¹⁹ atoms/cm³.
 21. The semiconductor device according to claim 15, further comprising: a third insulator covering at least the first insulator, the first oxide semiconductor film, and the second oxide semiconductor film, and a fourth insulator over the third insulator, wherein the fourth insulator comprises a region whose hydrogen concentration measured by secondary ion mass spectrometry is higher than that of a region of the second oxide semiconductor film. 